VLSI test : 12th Symposium : Apr 1994, Cherry Hill, NJ.

著者: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.ほか

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一般注記：: Papers.Also known as VTS '94. Theme: Forces driving test technology in the nineties: economics, quality, and reliability. IEEE cat no 94TH0645-2.Index...

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資料種別: 図書
ISBN: 0818654406 (pbk.)
0818654414 (microfiche)
タイトル: VLSI test : 12th Symposium : Apr 1994, Cherry Hill, NJ.
著者標目: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
出版事項: Los Alamitos, Calif. : IEEE Computer Society Press
出版年月日等: c1994.
出版年（W3CDTF）: 1994
数量: v.
並列タイトル等: Also known as VTS '94. Theme: Forces driving test technology in the nineties: economics, quality, and reliability. IEEE cat no 94TH0645-2
VLSI test ; IEEE ; VTS
NDLC: M17
ND
一般注記: Papers.
Also known as VTS '94. Theme: Forces driving test technology in the nineties: economics, quality, and reliability. IEEE cat no 94TH0645-2.
Index term: VLSI test ; IEEE ; VTS.
BL shelfmark: 4363.2365 12th 1994.
所蔵機関: 国立国会図書館
請求記号: M17-95-0347
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000003496501
http://id.ndl.go.jp/bib/000003496501
UKMARC番号: G02310320
整理区分コード: 215