16th VLSI test symposium : Apr 1998, Monterey, CA.

著者: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.ほか

資料に関する注記

一般注記：: Selected papers and abstracts.Also known as VTS '98. Theme: Test innovations for highly complex, high speed, dop submicron ICs. IEEE cat no 98TB100231...

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資料種別: 図書
ISBN: 0818684364 (pbk)
0818684380 (microfiche)
ISSN: 1093-0167
タイトル: 16th VLSI test symposium : Apr 1998, Monterey, CA.
著者標目: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
出版事項: IEEE Computer Society Press
出版年月日等: 1998.
出版年（W3CDTF）: 1998
数量: v.
並列タイトル等: Also known as VTS '98. Theme: Test innovations for highly complex, high speed, dop submicron ICs. IEEE cat no 98TB100231
VLSI test ; IEEE ; VTS
NDLC: M17
ND
一般注記: Selected papers and abstracts.
Also known as VTS '98. Theme: Test innovations for highly complex, high speed, dop submicron ICs. IEEE cat no 98TB100231.
Index term: VLSI test ; IEEE ; VTS.
BL shelfmark: 4363.2365 16th 1998.
所蔵機関: 国立国会図書館
請求記号: M17-99-0575
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000003508158
http://id.ndl.go.jp/bib/000003508158
UKMARC番号: G05673824
整理区分コード: 215