The 21st IEEE international symposium on defect and fault-tolerance in VLSI systems : proceedings : Arlington, Virginia, USA : October 4-6, 2006. : 2006 international symposium on defect and fault tolerance (DFT) in VLSI systems : Oct 2006, Arlington, VA.

• 資料種別: 図書
• ISBN: 076952706X; 9780769527062 (ISBN-13)
• ISSN: 1550-5774
• タイトル: The 21st IEEE international symposium on defect and fault-tolerance in VLSI systems : proceedings : Arlington, Virginia, USA : October 4-6, 2006. : 2006 international symposium on defect and fault tolerance (DFT) in VLSI systems : Oct 2006, Arlington, VA.
• 著者標目: Park, Nohpill.; IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (21st : 2006 : Arlington, Va.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2006.
• 出版年（W3CDTF）: 2006
• 数量: xii, 583 p. : ill. ; 28 cm.
• 並列タイトル等: 21st IEEE international symposium on defect and fault-tolerance in VLSI systems : (DFT 2006) : Arlington, Virginia : 04-06 October 2006
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Fault-tolerant computing -- Congresses.
• LCC: TK7874
• NDLC: M17
• 一般注記: Papers.; IEEE cat no P2706 (t.p. verso) , PR2706 (cover & spine) .
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-08-642
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009248744; http://id.ndl.go.jp/bib/000009248744
• LC control number: 2007296547; https://lccn.loc.gov/2007296547
• OCLC番号: 73515809; https://www.worldcat.org/oclc/73515809
• 整理区分コード: 215