Proceedings, Microscopy and Microanalysis 2000 : Microscopy Society of America 58th Annual Meeting : Microbeam Analysis Society 34th Annual Meeting : Microscopical Society of Canada/Societe de Microscopie du Canada 27th Annual Meeting, Philadelphia, Pennsylvania, August 13-17, 2000

• 資料種別: 図書
• タイトル: Proceedings, Microscopy and Microanalysis 2000 : Microscopy Society of America 58th Annual Meeting : Microbeam Analysis Society 34th Annual Meeting : Microscopical Society of Canada/Societe de Microscopie du Canada 27th Annual Meeting, Philadelphia, Pennsylvania, August 13-17, 2000
• 著者・編者: edited by G.W. Bailey ... [et al.]
• 著者標目: Microscopy Society of America; https://ci.nii.ac.jp/author/DA11037192; Annual Meeting Microscopy Society of America; https://ci.nii.ac.jp/author/DA08854699; Microbeam Analysis Society; https://ci.nii.ac.jp/author/DA09505695; Annual Meeting Microbeam Analysis Society; https://ci.nii.ac.jp/author/DA08854815; Microscopical Society of Canada; https://ci.nii.ac.jp/author/DA04266167; Microscopical Society of Canada. Annual Meeting; https://ci.nii.ac.jp/author/DA13272422; Bailey, G. W.; https://ci.nii.ac.jp/author/DA04271917
• 出版事項: Springer
• 出版年月日等: 2000
• 出版年（W3CDTF）: 2000
• 大きさ: 29 cm
• 並列タイトル等: Proceedings, Microscopy & Microanalysis 2000, Philadelphia, Pennsylvania, August 13-17, 2000, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Mexican Microscopy Society, Brazillian Society for Microscopy and Microanalysis, Venezuelan Society of Electron Microscopy
• 出版地（国名コード）: us
• 本文の言語コード: en
• 対象利用者: 一般
• 関連情報: Microscopy and Microanalysis; https://cir.nii.ac.jp/crid/1130282272497761664
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA54161211#entity
• 掲載誌: Microscopy and Microanalysis; https://cir.nii.ac.jp/crid/1130282272497761664
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA54161211 : BA54161211