Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

• 資料種別: 図書
• ISBN: 0818684941
• タイトル: Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA
• 著者・編者: sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
• 著者標目: IEEE International Workshop on Memory Technology, Design, and Testing; https://ci.nii.ac.jp/author/DA12300318; Lepejian, D.; IEEE Computer Society. Test Technology Technical Committee; https://ci.nii.ac.jp/author/DA03323957; IEEE Computer Society. Technical Committee on VLSI; https://ci.nii.ac.jp/author/DA04967445
• 出版事項: IEEE Computer Society Press
• 出版年月日等: c1998
• 出版年（W3CDTF）: 1998
• 大きさ: 28 cm
• 並列タイトル等: 98TB100236; Memory Technology, Design and Testing; MTDT'98
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Semiconductor storage devices -- Testing -- Congresses; Random access memory -- Congresses
• LCC: TK7895.M4
• 対象利用者: 一般
• 一般注記: "IEEE Order Plan Catalog Number 98TB100236"--T.p. verso; "IEEE Computer Society Order Number PR08494"--T.p. verso; Includes bibliographical references and index
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA43731238#entity; https://lccn.loc.gov/97202128
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA43731238 : BA43731238
• LC control number: 97202128; https://lccn.loc.gov/97202128