Evaluation of advanced semiconductor materials by electron microscopy

• 資料種別: 図書
• ISBN: 0306433621
• タイトル: Evaluation of advanced semiconductor materials by electron microscopy
• 著者・編者: edited by David Cherns
• 著者標目: NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy; https://ci.nii.ac.jp/author/DA04219735; Cherns, David; https://ci.nii.ac.jp/author/DA04219757; North Atlantic Treaty Organization. Scientific Affairs Division; https://ci.nii.ac.jp/author/DA00061796; Special Program on Condensed Systems of Low Dimensionality (NATO); https://ci.nii.ac.jp/author/DA04189394
• 出版事項: Plenum Press
• 出版年月日等: c1989
• 出版年（W3CDTF）: 1989
• 大きさ: 27 cm
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Semiconductors -- Surfaces -- Congresses; Electron microscopy -- Technique -- Congresses; Electrons -- Diffraction -- Congresses
• LCC: QC611.6.S9
• 対象利用者: 一般
• 一般注記: "Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p; "Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P; "Published in cooperation with NATO Scientific Affairs Division."; Includes bibliographical references and index
• 関連情報: NATO ASI series; https://cir.nii.ac.jp/crid/1130282270391633664
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA08059780#entity; https://lccn.loc.gov/89016354
• 掲載誌: NATO ASI series; https://cir.nii.ac.jp/crid/1130282270391633664
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA08059780 : BA08059780
• LC control number: 89016354; https://lccn.loc.gov/89016354