Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

• 資料種別: 図書
• ISBN: 0769516173; 0769516181
• タイトル: Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
• 巻次・部編番号: : bookbroker
• 著者・編者: editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
• 著者標目: IEEE International Workshop on Memory Technology, Design, and Testing; https://ci.nii.ac.jp/author/DA12300318; Courtois, B. (Bernard); https://ci.nii.ac.jp/author/DA09741734; Wik, T. (Thomas); Zorian, Yervant; IEEE Computer Society; https://ci.nii.ac.jp/author/DA00479199; IEEE Computer Society. Technical Committee on VLSI; https://ci.nii.ac.jp/author/DA04967445; IEEE Computer Society. Test Technology Technical Council; https://ci.nii.ac.jp/author/DA1250352X; IEEE Solid-State Circuits Society; https://ci.nii.ac.jp/author/DA13128277
• 出版事項: IEEE Computer Society
• 出版年月日等: c2002
• 出版年（W3CDTF）: 2002
• 大きさ: 28 cm
• 並列タイトル等: Memory technology, design and testing
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Semiconductor storage devices -- Testing -- Congresses; Random access memory -- Congresses
• LCC: TK7895.M4
• 対象利用者: 一般
• 一般注記: "IEEE Computer Society Order Number PR01617"--T.p. verso; "... 10th anniversary of the Workshop ..."--P. x; Includes bibliographical references and index; Also available via the World Wide Web
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA64790086#entity; https://lccn.loc.gov/2002512007
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA64790086 : BA64790086
• LC control number: 2002512007; https://lccn.loc.gov/2002512007