出版事項（掲載誌）American Physical Society (APS)
著作権情報http://link.aps.org/licenses/aps-default-license
参照Polaronic quasiparticle picture for generation dynamics of coherent phonons in semiconductors: Transient and nonlinear Fano resonance
Evaluation of Anisotropic Strain Relaxation in Strained Silicon-on-Insulator Nanostructure by Oil-Immersion Raman Spectroscopy
Raman Studies of Internal Stress and Crystallinity of Pulse-Laser-Irradiated Silicon on Sapphire (SOS) in Relation to Hall Mobility
Examination of phonon deformation potentials for accurate strain measurements in silicon–germanium alloys with the whole composition range by Raman spectroscopy
Doping-type dependence of phonon dephasing dynamics in Si
High Doping Activation (≥10<sup>20</sup> cm<sup>–3</sup>) in Tensile-Strained n-Ge Alloys Achieved by High-Speed Continuous-Wave Laser Annealing
Formation of compressively strained Si/Si1−xCx/Si(100) heterostructures using gas-source molecular beam epitaxy
Raman study of the quantum interference of multiple discrete states and a continuum of states in the phonon energy region of semiconductors: examples of<i>p</i>-type Ga<sub>0.5</sub>In<sub>0.5</sub>P films
Stress redistribution in individual ultrathin strained silicon nanowires: a high-resolution polarized Raman study
Raman Scattering Characterization of Residual Stresses in Silicon-on-Sapphire
Determination of Raman Phonon Strain Shift Coefficient of Strained Silicon and Strained SiGe
Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering
Experimental mechanical stress characterization of micro-electro-mechanical-systems device using confocal laser scanning microscope combined with Raman spectrometer system
連携機関・データベース国立情報学研究所 : CiNii Research