Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism

• 資料種別: 記事
• タイトル: Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism
• 著者標目: Kousuke Yokoyama; Taketoshi Ochi; Takayuki Uchihashi; Makoto Ashino; Yasuhiro Sugawara; Nobuhito Suehira; Seizo Morita
• 出版年月日等: 2000-01-01
• 出版年（W3CDTF）: 2000-01-01
• タイトル（掲載誌）: Review of Scientific Instruments
• 巻号年月日等（掲載誌）: 71 1
• 掲載巻: 71
• 掲載号: 1
• 掲載ページ: 128-132
• 掲載年月日（W3CDTF）: 2000-01-01
• ISSN（掲載誌）: 00346748
• 出版事項（掲載誌）: AIP Publishing
• 件名標目: Instrumentation
• 対象利用者: 一般
• DOI: 10.1063/1.1150174
• 作成日（W3CDTF）: 2002-07-26
• 関連情報（URI）: https://pubs.aip.org/aip/rsi/article-pdf/71/1/128/19089256/128_1_online.pdf
• 参照: Role of tip apices in scanning force spectroscopy on alkali halides at room temperature—chemical nature of the tip apex and atomic-scale deformations; https://cir.nii.ac.jp/crid/1360009142589253504; Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition; https://cir.nii.ac.jp/crid/1360285708874010368; Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces; https://cir.nii.ac.jp/crid/1360285708895363712; The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface; https://cir.nii.ac.jp/crid/1360285709395365504; Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance; https://cir.nii.ac.jp/crid/1360567184372801408; Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films; https://cir.nii.ac.jp/crid/1360567189594892288; Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method; https://cir.nii.ac.jp/crid/1390001205186328064; Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy; https://cir.nii.ac.jp/crid/1390001206252128768; Structures of an Oxygen-Deficient TiO₂(110) Surface Studied by Noncontact Atomic Force Microscopy; https://cir.nii.ac.jp/crid/1390001206253283328; Lateral manipulation of single defect on insulating surface using noncontact atomic force microscope; https://cir.nii.ac.jp/crid/1520853833009423488
• 連携機関・データベース: 国立情報学研究所 : CiNii Research; https://cir.nii.ac.jp/
• 提供元機関・データベース: Crossref; https://www.crossref.org

• 要約等: <jats:p>We present a design and performance of an optical beam deflection noncontact atomic force microscope (nc–AFM). The optical deflection detectio...