Suppression of charge carrier collection in diode with retrograde well and epitaxial layers for soft-error immunity

• 資料種別: 記事
• タイトル: Suppression of charge carrier collection in diode with retrograde well and epitaxial layers for soft-error immunity
• 著者標目: T. Kishimoto; M. Inuishi; T. Nishimura; Yuji Horino; Yoshikazu Ohno; Atsushi Kinomura; K. Fujii; Mikio Takai
• 出版年月日等: 1997-07-01
• 出版年（W3CDTF）: 1997-07-01
• タイトル（掲載誌）: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 巻号年月日等（掲載誌）: 130
• 掲載巻: 130
• 掲載ページ: 524-527
• 掲載年月日（W3CDTF）: 1997-07-01
• ISSN（掲載誌）: 0168583X
• 出版事項（掲載誌）: Elsevier BV
• 対象利用者: 一般
• DOI: 10.1016/s0168-583x(97)00244-9; https://doi.org/10.1016/s0168-583x(97)00244-9
• 連携機関・データベース: 国立情報学研究所 : CiNii Research; https://cir.nii.ac.jp/

• 要約等: One of the solutions to the reduction of soft errors is suppression of carrier collection generated by an energetic particle emitted from typical cont...