CVケーブルの絶縁特性に与える弱点および水分の影響 (最近の電力ケーブル技術<特集>)
Digital data available（科学技術振興機構）
Begin reading now
J-STAGE
Holdings of Libraries in Japan
This page shows libraries in Japan other than the National Diet Library that hold the material.
Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.
other
J-STAGE
DigitalCiNii Research
Search ServiceDigitalYou can check the holdings of institutions and databases linked to CiNii Research at this link.
Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 勝田 銀造 他
- Series Title
- Author Heading
- Periodical title
- 電気学会論文誌. B, 電力・エネルギー部門誌 = IEEJ transactions on power and energy
- No. or year of volume/issue
- 112(10) 1992.10
- Volume
- 112
- Issue
- 10
- Pages
- p853～862
- Publication date of volume/issue (W3CDTF)
- 1992-10
- ISSN (Periodical Title)
- 0385-4213
- ISSN-L (Periodical Title)
- 0385-4213
- Publication (Periodical Title)
- 東京 : 電気学会
- Place of Publication (Country Code)
- JP
- Text Language Code
- jpn
- NDLC
- Target Audience
- 一般
- Holding library
- 国立国会図書館
- Call No.
- Z16-794
- Data Provider (Database)
- 国立国会図書館 : 国立国会図書館雑誌記事索引
- Bibliographic ID (NDL)
- 3795435
- Bibliographic Record Category (NDL)
- 632
- Summary, etc.
- Sample cables including a few types of defects (such as voids, contaminants, and protrusions) with more volume than usual, were prepared intentionally for clarifying how these defects separately affect insulation characteristics, under the presence/non-presence of moisture. In the case of void inclusion, insulation characteristics is even more susceptible to AC voltage than impulse voltage, and the distribution of lifetimes is classified into a worn-out failure type due to discharge deterioration. While protrusions and some other contaminants can greatly deteriorate original dielectric strength, these defects have a relatively slight effect on long-term endurance in the atmosphere. Therefore, the distribution of lifetimes is classified into an early failure type. With refernce to influence of moisture, in strong electric field (exceeding 15kV/mm) and in a region of short-term, there is an increase in harmfulness around defects with water absorbed, thereby inducing electrical trees and resulting in a breakdown. In light electric field (no more than 15kV/mm) and in a region of a long-term, harmfulness of defects will not deepen to a considerable extent, and growth of water trees is influential very possibly.
- DOI
- 10.1541/ieejpes1990.112.10_853
- Access Restrictions
- インターネット公開
- Data Provider (Database)
- 科学技術振興機構 : J-STAGE
- Summary, etc.
- Sample cables including a few types of defects (such as voids, contaminants, and protrusions) with more volume than usual, were prepared intentionally for clarifying how these defects separately affect insulation characteristics, under the presence/non-presence of moisture. In the case of void inclusion, insulation characteristics is even more susceptible to AC voltage than impulse voltage, and the distribution of lifetimes is classified into a worn-out failure type due to discharge deterioration. While protrusions and some other contaminants can greatly deteriorate original dielectric strength, these defects have a relatively slight effect on long-term endurance in the atmosphere. Therefore, the distribution of lifetimes is classified into an early failure type. With refernce to influence of moisture, in strong electric field (exceeding 15kV/mm) and in a region of short-term, there is an increase in harmfulness around defects with water absorbed, thereby inducing electrical trees and resulting in a breakdown. In light electric field (no more than 15kV/mm) and in a region of a long-term, harmfulness of defects will not deepen to a considerable extent, and growth of water trees is influential very possibly.
- DOI
- 10.1541/ieejpes1990.112.10_853
- Access Restrictions
- インターネット公開
- Related Material (URI)
- Is Referenced By
- ボウ・タイ状水トリーからの電気トリー発生メカニズムの検討XLPEケーブルの破壊要因の検討
- Data Provider (Database)
- 国立情報学研究所 : CiNii Research
- Original Data Provider (Database)
- Japan Link Center雑誌記事索引データベースCrossrefCiNii ArticlesCrossrefCrossref
- Bibliographic ID (NDL)
- 3795435
- NAID
- 130006841243