解説走査トンネル顕微鏡,原子間力顕微鏡およびフーリエ変換赤外分光法による水素終端シリコン表面の分析(小特集表面における水素分析)

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Digital
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 記事
Title: 解説走査トンネル顕微鏡,原子間力顕微鏡およびフーリエ変換赤外分光法による水素終端シリコン表面の分析
Author/Editor: 高萩隆行
坂上弘之
Series Title: 小特集表面における水素分析
Author Heading: 高萩隆行
坂上弘之
Periodical title: 真空 = Journal of the Vacuum Society of Japan
No. or year of volume/issue: 42(10) 1999.10
Volume: 42
Issue: 10
Pages: 886～891
Publication date of volume/issue (W3CDTF): 1999-10
ISSN (Periodical Title): 0559-8516
ISSN-L (Periodical Title): 0559-8516
Publication (Periodical Title): 東京 : 日本真空協会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN15
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-474
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 4892002
http://id.ndl.go.jp/bib/4892002
Bibliographic Record Category (NDL): 632