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Investigation of random dopant fluctuation for multi-gate metal-oxide-semiconductor field-effect transistors using analytical solutions of three-dimensional poisson's equation

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Investigation of random dopant fluctuation for multi-gate metal-oxide-semiconductor field-effect transistors using analytical solutions of three-dimensional poisson's equation

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
9476976
Material type
記事
Author
Yu-Sheng Wuほか
Publisher
Tokyo : The Japan Society of Applied Physics
Publication date
2008-04
Material Format
Digital
Journal name
Japanese journal of applied physics : JJAP 47(4) (1) 2008.4
Publication Page
p.2097~2102
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Digital

Material Type
記事
Author/Editor
Yu-Sheng Wu
Pin Su
Author Heading
Periodical title
Japanese journal of applied physics : JJAP
No. or year of volume/issue
47(4) (1) 2008.4
Volume
47
Issue
4
Other Volume
1
Pages
2097~2102