Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.

• Material Type: 図書
• Title: Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.
• Title Heading: Electronics test.
• Author Heading: Automated Testing for Electronics Manufacturing Conference (1983 : Anaheim, Calif.); Automated Testing for Electronics Manufacturing Confernce.
• Publication, Distribution, etc.: New York, NY (2 Park Ave., New York 10016) : Morgan-Grampian Pub. Co.
• Publication Date: c1983.
• Publication Date (W3CDTF): 1983
• Extent: 300 p. in various pagings : ill. ; 28 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: 電子部品. Densibuhin.; 電子機械・器具 (軍事用) Densikikaikigu (gunziyo); 工業試験. Kogyosiken.; Electronic apparatus and appliances -- Testing -- Congresses.; Automatic checkout equipment -- Congresses.
• LCC: TK7836
• DDC: 621.381/028/7
• NDLC: ND354
• Note (General): "ATE West Conference."--Spine.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: ND354-A1
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000003104967; http://id.ndl.go.jp/bib/000003104967
• LC Control Number: 83120666; https://lccn.loc.gov/83120666
• Bibliographic Record Category (NDL): 211