Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.

Author: Automated Testing for Electronics Manufacturing Conference (1983 : Rosemont, Ill.)

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Material Type: 図書
Title: Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.
Title Heading: Electronics test.
Author Heading: Automated Testing for Electronics Manufacturing Conference (1983 : Rosemont, Ill.)
Publication, Distribution, etc.: [New York] : Morgan-Grampian Pub. Co.
Publication Date: c1983.
Publication Date (W3CDTF): 1983
Extent: 1 v. (various pagings) : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic apparatus and appliances -- Testing -- Congresses.
Automatic checkout equipment -- Congresses.
LCC: TK7836
DDC: 621.381/028/7
NDLC: M15
ND
Note (Bibliography): Includes bibliographies.
Holding library: 国立国会図書館
Call No.: M15-A5885
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003112674
http://id.ndl.go.jp/bib/000003112674
LC Control Number: 83244307
https://lccn.loc.gov/83244307
Bibliographic Record Category (NDL): 211