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博士論文

CHARACTERIZATION AND MODELING OF ELECTRICALLY ACTIVE POINT DEFECTS IN SILICON/SILICON DIOXIDE STRUCTURES

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CHARACTERIZATION AND MODELING OF ELECTRICALLY ACTIVE POINT DEFECTS IN SILICON/SILICON DIOXIDE STRUCTURES

Call No. (NDL)
M-DISC-829
Bibliographic ID of National Diet Library
000003433474
Material type
博士論文
Author
Andersson, Mats O.
Publisher
Chalmers Tekniska Högskola
Date granted
1991.
Material Format
Paper
Capacity, size, etc.
1v.
Degree grantor and degree
Chalmers Tekniska Högskola
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Chalmers University of Technology.

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Paper

Material Type
博士論文
Title
CHARACTERIZATION AND MODELING OF ELECTRICALLY ACTIVE POINT DEFECTS IN SILICON/SILICON DIOXIDE STRUCTURES
Author/Editor
Andersson, Mats O.
Author Heading
Andersson, Mats O.
Publication, Distribution, etc.
Göteborg : Chalmers Tekniska Högskola
Publication Date
1991.
Extent
1v.
Degree Grantor
Chalmers Tekniska Högskola
Date Granted
1991.
Date Granted (W3CDTF)
1991