Jump to main content

図書

Beam injection assessment of microstructures in semiconductors -- : Beam injection assessment of microstructures in semiconductors : International workshop : 6th : Nov 2000, Fukuoka, Japan. (Diffusion and Defect Data Part B Solid State Phenomena ; 78,79)

Icons representing 図書

Beam injection assessment of microstructures in semiconductors -- : Beam injection assessment of microstructures in semiconductors : International workshop : 6th : Nov 2000, Fukuoka, Japan.

(Diffusion and Defect Data Part B Solid State Phenomena ; 78,79)

Call No. (NDL)
M17-01-3130
Bibliographic ID of National Diet Library
000003451898
Material type
図書
Author
-
Publisher
Scitec
Publication date
2001.
Material Format
Paper
Capacity, size, etc.
v.
NDC
-
View All

Notes on use

Note (General)：

Papers.Also known as BIAMS 2000. ISSN for Diffusion and Defect Date: 03776883.Index term: BIAMS ; microstructures ; semiconductors ; beam injection....

Search by Bookstore

Search by Bookstore

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
3908450616 (pbk)
ISSN
1012-0394
Title
Beam injection assessment of microstructures in semiconductors -- : Beam injection assessment of microstructures in semiconductors : International workshop : 6th : Nov 2000, Fukuoka, Japan.
Series Title
Diffusion and Defect Data Part B Solid State Phenomena ; 78,79
Publication, Distribution, etc.
Scitec
Publication Date
2001.
Publication Date (W3CDTF)
2001
Extent
v.
Alternative Title
Also known as BIAMS 2000. ISSN for Diffusion and Defect Date: 03776883
BIAMS ; microstructures ; semiconductors ; beam injection