Semicon, Southwest 2000 : reliability implications of changes in semiconductor materials. : ------.

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Material Type: 図書
Title: Semicon, Southwest 2000 : reliability implications of changes in semiconductor materials. : ------.
Author Heading: Semiconductor Equipment and Materials International.
SEMATECH.
Publication, Distribution, etc.: SEMI
Publication Date: c2000.
Publication Date (W3CDTF): 2000
Extent: v.
NDLC: M17
Note (General): Presentations.
Holding library: 国立国会図書館
Call No.: M17-03-1166
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004082569
http://id.ndl.go.jp/bib/000004082569
Bibliographic Record Category (NDL): 215