Bias in calculated k(eff) from subcritical measurements by the 252Cf-source-driven noise analysis method CONF-9509100-6 DE95 014587

Bias in calculated k(eff) from subcritical measurements by the 252Cf-source-driven noise analysis method

CONF-9509100-6 DE95 014587

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Material Type: 規格・テクニカルリポート類
Title: Bias in calculated k(eff) from subcritical measurements by the 252Cf-source-driven noise analysis method
Author/Editor: Mihalczo, J. T
Valentine, T. E
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 10 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : CONF-9509100-6
テクニカルリポート番号 : DE95 014587
Holding library: 国立国会図書館
Call No.: LS-DE95/014587
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005534442
http://id.ndl.go.jp/bib/000005534442
Bibliographic Record Category (NDL): 291