Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales ANL/MSD/CP-91226 DE97 001157 CONF-96104014

Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales

ANL/MSD/CP-91226 DE97 001157 CONF-96104014

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Material Type: 規格・テクニカルリポート類
Title: Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales
Author/Editor: Koshelev, I
Paulikas, A. P
Veal, B. W
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 15 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/MSD/CP-91226
テクニカルリポート番号 : DE97 001157
テクニカルリポート番号 : CONF-96104014
Holding library: 国立国会図書館
Call No.: LS-DE97/001157
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005865959
http://id.ndl.go.jp/bib/000005865959
Bibliographic Record Category (NDL): 291