Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.

• Material Type: 図書
• ISBN: 1424410142 (softbound ed.); 9781424410149 (ISBN-13 : softbound ed.)
• Title: Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.
• Author Heading: IEEE ED/SSC Chapter, Bangalore.; Mahapatra, Souvik.; Radhakrishnan, M. K.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (14th : 2007 : Indian Institute of Science)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2007.
• Publication Date (W3CDTF): 2007
• Extent: 309 p. : ill. ; 28 cm.
• Alternative Title: Proceedings of the 14th international symposium on the physical and failure analysis of integrated circuits : IPFA 2007; 2007 14th international symposium on the physical and failure analysis of integrated circuit : IPFA 2007 : Bangalore, India : 11-13 July 2007
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.
• LCC: TK7874
• DDC: 621.3815/48
• NDLC: M17
• Note (General): Papers.; IEEE cat no 07TH8945 (t.p. verso) , CFP07777-PRT (cover & spine) .
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-09-1411
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000010075633; http://id.ndl.go.jp/bib/000010075633
• LC Control Number: 2007920884; https://lccn.loc.gov/2007920884
• OCLC No.: 256530019; https://www.worldcat.org/oclc/256530019
• Bibliographic Record Category (NDL): 215