Damage to VUV, EUV, and X-ray optics VI : 24-25 April 2017 : Prague, Czech Republic : Apr 2017, Prague, Czech Republic. (SPIE Proceedings ; 10236)

Damage to VUV, EUV, and X-ray optics VI : 24-25 April 2017 : Prague, Czech Republic : Apr 2017, Prague, Czech Republic.

(SPIE Proceedings ; 10236)

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Material Type: 図書
ISBN: 9781510609730
ISSN (series): 0277-786X
Title: Damage to VUV, EUV, and X-ray optics VI : 24-25 April 2017 : Prague, Czech Republic : Apr 2017, Prague, Czech Republic.
Series Title: SPIE Proceedings ; 10236
Author Heading: Science and Technology Facilities Council (Great Britain)
Publication, Distribution, etc.: Bellingham, Washington, USA : SPIE (出版)
Publication Date: [2017]
Publication Date (W3CDTF): 2017
Extent: 1 volume (various pagings)
Size: 28 cm.
Alternative Title: Damage to VUV, EUV, and X-ray optics 6 : 24-25 April 2017 : Prague, Czech Republic
SPIE. optics + optoelectronics
Place of Publication (Country Code): US
Text Language Code: eng
Content Type: text
Media Type: unmediated
Carrier Type: volume
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-18-1823
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028500664
http://id.ndl.go.jp/bib/028500664
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215