博士論文

A study on experimental characterization of radiation-induced soft errors for low voltage VLSI circuits

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A study on experimental characterization of radiation-induced soft errors for low voltage VLSI circuits

Persistent ID (NDL)
info:ndljp/pid/9376081
Material type
博士論文
Author
原田, 諒
Publisher
原田, 諒
Publication date
2014
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
大阪大学,博士(情報科学)
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Digital

Material Type
博士論文
Author/Editor
原田, 諒
Publication, Distribution, etc.
Publication Date
2014
Publication Date (W3CDTF)
2014
Alternative Title
低電圧回路における放射線起因ソフトエラーの実験的評価に関する研究
Degree grantor/type
大阪大学
Date Granted
2014-03-25
Date Granted (W3CDTF)
2014-03-25