図書

Discusses AEOD 940404-07 visit to plant to gather info on cause of SDG inadvertent starts.Advises that tests show that existing start transistors from SDG control circuit fail to operate when environmental temp reaches over 100 F.

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Discusses AEOD 940404-07 visit to plant to gather info on cause of SDG inadvertent starts.Advises that tests show that existing start transistors from SDG control circuit fail to operate when environmental temp reaches over 100 F.

Material type
図書
Author
LEE, E. J.
Publisher
NRC OFFICE FOR ANALYSIS & EVALUATION OF OPERATIONAL DATA (AEOD)
Publication date
1994/04/13.
Material Format
Paper
Capacity, size, etc.
-
NDC
-
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Paper

Material Type
図書
Title
Discusses AEOD 940404-07 visit to plant to gather info on cause of SDG inadvertent starts.Advises that tests show that existing start transistors from SDG control circuit fail to operate when environmental temp reaches over 100 F.
Author/Editor
LEE, E. J.
Author Heading
LEE, E. J.
Publication, Distribution, etc.
NRC OFFICE FOR ANALYSIS & EVALUATION OF OPERATIONAL DATA (AEOD)
Publication Date
1994/04/13.
Publication Date (W3CDTF)
1994
Place of Publication (Country Code)
un
Text Language Code
eng
Target Audience
一般