Semiconductor material and device characterization 2nd ed (A Wiley-Interscience publication)

Semiconductor material and device characterization

2nd ed

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Material Type: 図書
ISBN: 0471241393
Title: Semiconductor material and device characterization
Author/Editor: Dieter K. Schroder
Edition: 2nd ed
Series Title: A Wiley-Interscience publication
Author Heading: Schroder, Dieter K.
Publication, Distribution, etc.: New York : Wiley
Publication Date: c1998
Extent: xxiv, 760 p. : ill. ; 25 cm
Text Language Code: eng
LCC: QC611
NDLC: MC151
Target Audience: 一般
Note (General): Includes bibliographical references and index
Data Provider (Database): 農林水産関係試験研究機関 : 農林水産関係試験研究機関総合目録
http://opac.cc.affrc.go.jp/
LC Control Number: 97052094
http://lccn.loc.gov/97052094