2015 IEEE International Test Conference : (ITC 2015) : Anaheim, California, USA, 6-8 October 2015

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Note (General)：: "IEEE catalog Number: CFP15ITC-POD"Includes bibliographical references

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Material Type: 図書
ISBN: 9781467365796
Title: 2015 IEEE International Test Conference : (ITC 2015) : Anaheim, California, USA, 6-8 October 2015
Author Heading: International Test Conference
https://ci.nii.ac.jp/author/DA0261156X
Institute of Electrical and Electronics Engineers
https://ci.nii.ac.jp/author/DA00739948
Publication, Distribution, etc.: IEEE
Publication Date: c2015
Publication Date (W3CDTF): 2015
Size: 28 cm
Alternative Title: CFP15ITC-POD
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog Number: CFP15ITC-POD"
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BB20991849#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB20991849 : BB20991849