The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy : proceedings

Author: edited by F. Lombardi ... [et al.] ; sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing

Notes on use

Note (General)：: Includes bibliographical references and index"IEEE Computer Society Press order number 3502-02""IEEE catalog number 93TH0571-0"

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Material Type: 図書
ISBN: 0818635029
Title: The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy : proceedings
Author/Editor: edited by F. Lombardi ... [et al.] ; sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing
Author Heading: Lombardi, Fabrizio
https://ci.nii.ac.jp/author/DA09292459
IEEE Computer Society
https://ci.nii.ac.jp/author/DA00479199
IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
https://ci.nii.ac.jp/author/DA00923007
International Workshop on Defect and Fault Tolerance in VLSI Systems
https://ci.nii.ac.jp/author/DA04057291
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: c1993
Publication Date (W3CDTF): 1993
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes bibliographical references and index
"IEEE Computer Society Press order number 3502-02"
"IEEE catalog number 93TH0571-0"
Related Material (URI): https://ci.nii.ac.jp/ncid/BA21465414#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA21465414 : BA21465414