Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico : microfiche

Material type: 図書

Author: sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

Publisher: IEEE Computer Society

Publication date: c1998

Material Format: Paper

Capacity, size, etc.: 23 cm

NDC: -

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Notes on use

Note (General)：: Includes bibliographical references and index"Sponsored by ..., The IEEE Computer Society Test Technology Technical Committee" -- cover"IEEE Computer ...

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Paper

Material Type: 図書
ISBN: 076950325X
0769503276
Title: Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico
Volume: : microfiche
Author/Editor: sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
Author Heading: IEEE Computer Society
https://ci.nii.ac.jp/author/DA00479199
IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
https://ci.nii.ac.jp/author/DA00923007
IEEE Computer Society. Test Technology Technical Council
https://ci.nii.ac.jp/author/DA1250352X
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
https://ci.nii.ac.jp/author/DA1185577X
Publication, Distribution, etc.: IEEE Computer Society
Publication Date: c1998
Publication Date (W3CDTF): 1999
Size: 23 cm
Alternative Title: 1999 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
PR00325
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes bibliographical references and index
"Sponsored by ..., The IEEE Computer Society Test Technology Technical Committee" -- cover
"IEEE Computer Society Press order number PR00325"
"IEEE order plan catalog number PR00325"
Related Material (URI): https://ci.nii.ac.jp/ncid/BA45729951#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA45729951 : BA45729951