図書

Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California : case

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Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California : case

Material type
図書
Author
sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
Publisher
IEEE Computer Society
Publication date
c2001
Material Format
Paper
Capacity, size, etc.
23 cm
NDC
-
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Notes on use

Note (General):

Includes bibliographical references and index"IEEE Computer Society Press Order Number PR01203"--on T.p. verso

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Paper

Material Type
図書
ISBN
0769512038
0769512046
Volume
: case
Author/Editor
sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
Publication, Distribution, etc.
Publication Date
c2001
Publication Date (W3CDTF)
2001
Size
23 cm