2003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California : softbound

Author: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers

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Note (General)：: "IEEE catalog number 03TH8723"--T.p. versoIncludes bibliographical references

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Material Type: 図書
ISBN: 0790801043
Title: 2003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California
Volume: : softbound
Author/Editor: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers
Author Heading: GaAs Reliability Workshop
JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
Publication, Distribution, etc.: JEDEC
Publication Date: [2003]
Publication Date (W3CDTF): 2003
Size: 28 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog number 03TH8723"--T.p. verso
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA7156583X#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA7156583X : BA7156583X