Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society

Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society

Material type: 図書

Author: editors. L. D. Peachey, D. B. Williams

Publisher: San Francisco Press

Publication date: c1990

Material Format: Paper

Capacity, size, etc.: 26 cm

NDC: -

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Paper

Material Type: 図書
Title: Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society
Author/Editor: editors. L. D. Peachey, D. B. Williams
Author Heading: International Congress on Electron Microscopy
https://ci.nii.ac.jp/author/DA0164983X
Peachey, L. D.
https://ci.nii.ac.jp/author/DA05681823
Williams, David B. (David Bernard)
https://ci.nii.ac.jp/author/DA0078254X
Publication, Distribution, etc.: San Francisco Press
Publication Date: c1990
Publication Date (W3CDTF): 1990
Size: 26 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Related Material (URI): https://ci.nii.ac.jp/ncid/BA11818868#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA11818868 : BA11818868