Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan : microfiche : hard

Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan : microfiche

Author: sponsored by IEEE Computer Society Test Technology Technical Committee

Notes on use

Note (General)：: "IEEE Computer Society Press order number 2985.""IEEE Catalog Number 92TH0458-0"Includes bibliographies and index

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Material Type: 図書
ISBN: 0818629851
081862986X
0818629878
Title: Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan
Volume: : microfiche
: hard
Author/Editor: sponsored by IEEE Computer Society Test Technology Technical Committee
Author Heading: Asian Test Symposium
IEEE Computer Society. Test Technology Technical Committee
https://ci.nii.ac.jp/author/DA03323957
Institute of Electrical and Electronics Engineers
https://ci.nii.ac.jp/author/DA00739948
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: 1992
Publication Date (W3CDTF): 1992
Size: 28 cm
Alternative Title: ATS '92 Proceedings
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Testing -- Congresses
Automatic test equipment -- Congresses
LCC: TK7874
Target Audience: 一般
Note (General): "IEEE Computer Society Press order number 2985."
"IEEE Catalog Number 92TH0458-0"
Includes bibliographies and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA20318312#entity
https://lccn.loc.gov/92071801
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA20318312 : BA20318312
LC Control Number: 92071801
https://lccn.loc.gov/92071801