Process and device simulation for MOS-VLSI circuits (Netherlands)

Material type: 図書

Author: edited by Paolo Antognetti ... [et al.]

Publisher: Nijhoff

Publication date: 1983

Material Format: Paper

Capacity, size, etc.: 25 cm

NDC: -

View All

Notes on use

Note (General)：: "Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, SOGESTA, Urbino, Italy, July 12-23, 1982"--T...

Related materials as well as pre- and post-revision versions

NATO ASI series

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 902472824X
Title: Process and device simulation for MOS-VLSI circuits
Volume: (Netherlands)
Author/Editor: edited by Paolo Antognetti ... [et al.]
Author Heading: NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits
Antognetti, Paolo
Publication, Distribution, etc.: Nijhoff
Distributors for the U.S. and Canada, Kluwer Boston
Publication Date: 1983
Publication Date (W3CDTF): 1983
Size: 25 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Very large scale integration -- Simulation methods -- Congresses
Metal oxide semiconductors -- Simulation methods -- Congresses
LCC: TK7874
Target Audience: 一般
Note (General): "Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, SOGESTA, Urbino, Italy, July 12-23, 1982"--T.p. verso
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references
Related Material: NATO ASI series
https://cir.nii.ac.jp/crid/1130282270391633664
Related Material (URI): https://ci.nii.ac.jp/ncid/BA07247854#entity
https://lccn.loc.gov/83004018
Periodical Title: NATO ASI series
https://cir.nii.ac.jp/crid/1130282270391633664
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA07247854 : BA07247854
LC Control Number: 83004018
https://lccn.loc.gov/83004018