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Correlation of intermediate ion energy induced extended defect continuity to enhanced pinning potential in Tl-2212 films SAND981418C DE98 003554

Correlation of intermediate ion energy induced extended defect continuity to enhanced pinning potential in Tl-2212 films SAND981418C DE98 003554
Microform規格・テクニカルリポート類
Newcomer, P. P, Venturini, E. L, Doyle, B. L, Brice, D. K, Schoene, H1998<LS-DE98/003554>
National Diet Library

New approach to nuclear microscopy: The ion-electron emission microscope SAND982133C DE99 000588

New approach to nuclear microscopy: The ion-electron emission microscope SAND982133C DE99 000588
Microform規格・テクニカルリポート類
Doyle, B. L, Vizkelethy, G, Walsh, D. S, Senftinger, B, Mellon, M1998<LS-DE99/000588>
National Diet Library

Tritium retention and removal on TFTR SAND980899C DE98 004672

Tritium retention and removal on TFTR SAND980899C DE98 004672
Microform規格・テクニカルリポート類
Mueller, D, Blanchard, W, Doyle, B. L1997<LS-DE98/004672>
National Diet Library

Time-resolved ion beam induced charge collection (TRIBICC) in micro- electronics SAND981702C DE98 007169 CONF980705

Time-resolved ion beam induced charge collection (TRIBICC) in micro- electronics SAND981702C DE98 007169 CONF980705
Microform規格・テクニカルリポート類
Schoene, H, Walsh, D. S, Sexton, F. W, Doyle, B. L, Aurand, J. F1998<LS-DE98/007169>
National Diet Library

Tritium removal by CO(sub 2) laser heating SAND-97-2554C DE98 000561 CONF-971065

Tritium removal by CO(sub 2) laser heating SAND-97-2554C DE98 000561 CONF-971065
Microform規格・テクニカルリポート類
Skinner, C. H, Kugel, H, Mueller, D, Doyle, B. L, Wampler, W. R1997<LS-DE98/000561>
National Diet Library

Performance of an acousto-optic Bragg cell under ion microbeam irradiation SAND-97-1707C DE97 007165 CONF-9611204

Performance of an acousto-optic Bragg cell under ion microbeam irradiation SAND-97-1707C DE97 007165 CONF-9611204
Microform規格・テクニカルリポート類
Paxton, A. H, Schone, H, Taylor, E. W, McKinney, S, Doyle, B. L1997<LS-DE97/007165>
National Diet Library

HRTEM of extended defects in Tl-2212 thin films SAND-97-0218C DE97 002643 CONF-96120253

HRTEM of extended defects in Tl-2212 thin films SAND-97-0218C DE97 002643 CONF-96120253
Microform規格・テクニカルリポート類
Newcomer, P. P, Venturini, E. L, Doyle, B. L, Schoene, H, Myers, K. E1997<LS-DE97/002643>
National Diet Library

Highly focused ion beams in integrated circuit testing SAND-96-2452C DE97 000751 CONF-96092802

Highly focused ion beams in integrated circuit testing SAND-96-2452C DE97 000751 CONF-96092802
Microform規格・テクニカルリポート類
Horn, K. M, Dodd, P. E, Doyle, B. L1996<LS-DE97/000751>
National Diet Library

Using heavy ion backscattering spectrometry (HIBS) to solve integrated circuit manufacturing problems SAND-97-3114C DE98 001699 CONF-970785

Using heavy ion backscattering spectrometry (HIBS) to solve integrated circuit manufacturing problems SAND-97-3114C DE98 001699 CONF-970785
Microform規格・テクニカルリポート類
Banks, J. C, Doyle, B. L, Knapp, J. A, Werho, D, Gregory, R. B1997<LS-DE98/001699>
National Diet Library

Verification of three dimensional charge transport simulations using ion microbeams SAND-96-2837C DE97 000924 CONF-9611201

Verification of three dimensional charge transport simulations using ion microbeams SAND-96-2837C DE97 000924 CONF-9611201
Microform規格・テクニカルリポート類
Horn, K. M, Dodd, P. E, Breese, M. B. H, Doyle, B. L1996<LS-DE97/000924>
National Diet Library

Low-energy beta spectroscopy using pin diodes to monitor tritium surface contamination SAND-94-0939 DE94 015777

Low-energy beta spectroscopy using pin diodes to monitor tritium surface contamination SAND-94-0939 DE94 015777
Microform規格・テクニカルリポート類
Wampler, W. R, Doyle, B. L1994<LS-DE94/015777>
National Diet Library

Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection SAND-94-1071C DE95 001620 CONF-94081781

Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection SAND-94-1071C DE95 001620 CONF-94081781
Microform規格・テクニカルリポート類
Lee, S. R, Doyle, B. L, Drummond, T. J, Medernach, J. W, Schneider, R. P1994<LS-DE95/001620>
National Diet Library

Composition and Bonding in Amorphous Carbon Films Grown by Ion Beam Assisted Deposition: Influence of the Assistance Voltage (SAND ; SAND-98-2557J)

Composition and Bonding in Amorphous Carbon Films Grown by Ion Beam Assisted Deposition: Influence of the Assistance Voltage (SAND ; SAND-98-2557J)
Paper図書
J.M. Albella [et al.]1998
Other Libraries in Japan
  • Author HeadingAlbella, J.M. Banks, J.C. Climent-Font, A. Doyle, B.L. Gago, R. Jimenez, I. Terminel...

TIME-OF-FLIGHT DETECTOR FOR HEAVY ION BACKSCATTERING SPECTROMETRY (SAND ; SAND-94-0391)

TIME-OF-FLIGHT DETECTOR FOR HEAVY ION BACKSCATTERING SPECTROMETRY (SAND ; SAND-94-0391)
Paper図書
KNAPP, J.A.// BANKS, J.C.// DOYLE, B.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingKNAPP, J.A. BANKS, J.C. DOYLE, B.L.

LOW-ENERGY BETA SPECTROSCOPY USING PIN DIODES TO MONITOR TRITIUM SURFACE CONTAMINATION (SAND ; SAND-94-0939)

LOW-ENERGY BETA SPECTROSCOPY USING PIN DIODES TO MONITOR TRITIUM SURFACE CONTAMINATION (SAND ; SAND-94-0939)
Paper図書
WAMPLER, W.R.// DOYLE, B.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingWAMPLER, W.R. DOYLE, B.L.

RECIPROCAL SPACE MAPPING OF EPITAXIAL MATERIALS USING POSITION- SENSITIVE X-RAY DETECTION (SAND ; SAND-94-1071C)

RECIPROCAL SPACE MAPPING OF EPITAXIAL MATERIALS USING POSITION- SENSITIVE X-RAY DETECTION (SAND ; SAND-94-1071C)
Paper図書
LEE, S.R.// DOYLE, B.L.// DRUMMOND, T.J.// MEDERNACH, J.W.// SCHNEIDER, R.P. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingLEE, S.R. DOYLE, B.L. DRUMMOND, T.J. MEDERNACH, J.W...

TIME-OF-FLIGHT HEAVY ION BACKSCATTERING SPECTROMETRY (SAND ; SAND-93-0785C)

TIME-OF-FLIGHT HEAVY ION BACKSCATTERING SPECTROMETRY (SAND ; SAND-93-0785C)
Paper図書
KNAPP, J.A.// BANKS, J.C.// DOYLE, B.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingKNAPP, J.A. BANKS, J.C. DOYLE, B.L.

MICRO-RADIOSURGERY: A NEW CONCEPT FOR RADIOTHERAPY BASED UPON LOW ENERGY, ION-INDUCED NUCLEAR REACTIONS (SAND ; SAND-92-2410C)

MICRO-RADIOSURGERY: A NEW CONCEPT FOR RADIOTHERAPY BASED UPON LOW ENERGY, ION-INDUCED NUCLEAR REACTIONS (SAND ; SAND-92-2410C)
Paper図書
HORN, K.M.// DOYLE, B.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan
  • Author HeadingHORN, K.M. DOYLE, B.L.

NON-TRADITIONAL ION BEAM ANALYSES (SAND ; SAND-93-0193C)

NON-TRADITIONAL ION BEAM ANALYSES (SAND ; SAND-93-0193C)
Paper図書
DOYLE, B.L.// KNAPP, J.A.// BANKS, J.C.// BARBOUR, J.C.// WALSH, D.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingDOYLE, B.L. KNAPP, J.A. BANKS, J.C. BARBO...

RELATIONSHIP BETWEEN IBICC IMAGING AND SEU IN CMOS ICS (SAND ; SAND-93-0595C)

RELATIONSHIP BETWEEN IBICC IMAGING AND SEU IN CMOS ICS (SAND ; SAND-93-0595C)
Paper図書
SEXTON, F.W.// HORN, K.M.// DOYLE, B.L.// LAIRD, J.S.// CHOLEWA, M.// SAINT, A.// LEGGE, G.J.F. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingSEXTON, F.W. HORN, K.M. DOYLE, B.L. LAIRD, J.S. CHOLEWA, M. SAINT...
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