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Search results 14

Optical systems design 2015: optical fabrication, testing, and metrology V : 7-10 September 2015 : Jena, Germany : Sep 2015, Jena, Germany. (SPIE Proceedings ; 9628)

Optical systems design 2015: optical fabrication, testing, and metrology V : 7-10 September 2015 : Jena, Germany : Sep 2015, Jena, Germany. (SPIE Proceedings ; 9628)
Paper図書
SPIE[2015]<M17-16-284>
National Diet Library
  • Author HeadingDuparré, Angela. Geyl, Roland. European Optica...

Optical fabrication, testing, and metrology 4 : 7-8 September 2011 : Marseille, France : Sep 2011, Marseille, France. (SPIE Proceedings ; 8169)

Optical fabrication, testing, and metrology 4 : 7-8 September 2011 : Marseille, France : Sep 2011, Marseille, France. (SPIE Proceedings ; 8169)
Paper図書
SPIEc2011.<M17-12-2021>
National Diet Library
  • Author HeadingDuparré, Angela. Geyl, Roland. POPsud-Optitec ...

Optical fabrication, testing, and metrology 3 : 2-4 September 2008 : Glasgow, United Kingdom. : Sep 2008, Glasgow, UK. (SPIE Proceedings ; 7102)

Optical fabrication, testing, and metrology 3 : 2-4 September 2008 : Glasgow, United Kingdom. : Sep 2008, Glasgow, UK. (SPIE Proceedings ; 7102)
Paper図書
SPIEc2008.<M17-09-473>
National Diet LibraryOther Libraries in Japan
  • Author HeadingEuropaische Forschungsgesellschaft Dunne Schichten. Duparre, Angela. Geyl, Roland.

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)
Paper図書
SPIEc2007.<M17-07-2920>
National Diet LibraryOther Libraries in Japan
  • Author HeadingDuparré, Angela. Singh, Bhanwar. Gu, Zu-Han.

Optical fabrication, testing, and metrology 2 : 13-15 September 2005 : Jena, Germany. : Sep 2005, Jena, Germany. (SPIE Proceedings ; 5965)

Optical fabrication, testing, and metrology 2 : 13-15 September 2005 : Jena, Germany. : Sep 2005, Jena, Germany. (SPIE Proceedings ; 5965)
Paper図書
SPIEc2005.<M17-06-243>
National Diet Library
  • Author HeadingEuropean Optical Society (EOS) Duparré, Angela. Geyl, Roland. Wang, Lingli.

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)
Paper図書
SPIEc2003.<M17-04-1398>
National Diet Library
  • Author HeadingDuparré, Angela. Singh, Bhanwar.

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4779)

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4779)
Paper図書
SPIEc2002.<M17-03-637>
National Diet Library
  • Author HeadingBoeing Company. Duparré, Angela. Singh, Bhanwar.

Optical metrology roadmap for the semiconductor, optical, and data storage industries 2 : 2-3 August 2001 : San Diego, USA. : 46th annual SPIE international symposium on optical science and technology : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4449)

Optical metrology roadmap for the semiconductor, optical, and data storage industries 2 : 2-3 August 2001 : San Diego, USA. : 46th annual SPIE international symposium on optical science and technology : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4449)
Paper図書
SPIEc2001.<M17-03-3089>
National Diet Library
  • Author HeadingDuparré, Angela. Singh, Bhanwar.

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA
Paper図書
Angela Duparré, Bhanwar Singh, Zu-Han GU, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan

Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany pbk.

Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany pbk.
Paper図書
Angela Duparré, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universität Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft für Angewandte Optik e.V. (Germany), Optonet e.V. (Germany)SPIEc2005
Other Libraries in Japan

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
Paper図書
Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical EngineeringSPIEc2003
Other Libraries in Japan

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA
Paper図書
Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]SPIEc2002
Other Libraries in Japan

Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA

Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA
Paper図書
Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical EngineeringSPIEc2001
Other Libraries in Japan

Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA

Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA
Paper図書
Ghanim A. Al-Jumaily, ... [et al.] chair/editor ; sponsored by SPIE--the International Society for Optical EngineeringSPIE--the International Society for Optical Engineeringc2000
Other Libraries in Japan

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