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Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors BNL-60273 DE94 013538 CONF-9410613

Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors BNL-60273 DE94 013538 CONF-9410613
Microform規格・テクニカルリポート類
Eremin, V, Ivanov, A, Verbitskaya, E, Li, Z, Kraner, H. W1994<LS-DE94/013538>
National Diet Library

Study of the long term stability of the effective concentration of ionized space charges (N(sub eff)) of neutron irradiated silicon detectors fabricated by various thermal oxidations BNL-60294 DE94 013734 CONF-9410614

Study of the long term stability of the effective concentration of ionized space charges (N(sub eff)) of neutron irradiated silicon detectors fabricated by various thermal oxidations BNL-60294 DE94 013734 CONF-9410614
Microform規格・テクニカルリポート類
Li, Z, Chen, W, Kraner, H. W, Eremin, V, Lindstroem, G1994<LS-DE94/013734>
National Diet Library

Influence of oxidation on radiation hardness of silicon detectors BNL-60905 DE95 002466 CONF-93071634

Influence of oxidation on radiation hardness of silicon detectors BNL-60905 DE95 002466 CONF-93071634
Microform規格・テクニカルリポート類
Kraner, H. W, Li, Z, Lazanu, S, Biggeri, U, Borchi, E1993<LS-DE95/002466>
National Diet Library

Nuclear radiation detector materials : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, E.E. Haller, H.W. Kraner, and W.A. Higinbotham. (Materials Research Society symposia proceedings ; v. 16)

Nuclear radiation detector materials : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, E.E. Haller, H.W. Kraner, and W.A. Higinbotham. (Materials Research Society symposia proceedings ; v. 16)
Paper図書
North-Hollandc1983.<M15-A2938>
National Diet Library

ELEVATED TEMPERATURE ANNEALING OF THE NEUTRON INDUCED LEAKAGE CURRENT AND CORRESPONDING DEFECT LEVELS IN LOW AND HIGH RESISTIVITY SILICON DETECTORS (BNL ; BNL-60273)

ELEVATED TEMPERATURE ANNEALING OF THE NEUTRON INDUCED LEAKAGE CURRENT AND CORRESPONDING DEFECT LEVELS IN LOW AND HIGH RESISTIVITY SILICON DETECTORS (BNL ; BNL-60273)
Paper図書
EREMIN, V.// IVANOV, A.// VERBITSKAYA, E.// LI, Z.// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1994.
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  • Author HeadingEREMIN, V. IVANOV, A. VERBITSKAYA, E. LI, Z. KRANER, H.W.

FAST NEUTRON RADIATION DAMAGE EFFECTS ON HIGH RESISTIVITY SILICON JUNCTION DETECTORS (BNL ; BNL-46198(REV.))

FAST NEUTRON RADIATION DAMAGE EFFECTS ON HIGH RESISTIVITY SILICON JUNCTION DETECTORS (BNL ; BNL-46198(REV.))
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1992.
Other Libraries in Japan
  • Author HeadingLI, ZHENG KRANER, H.W.

FABRICATION OF LARGE AREA SI CYLINDRICAL DRIFT DETECTORS (BNL ; BNL-49016(REV.))

FABRICATION OF LARGE AREA SI CYLINDRICAL DRIFT DETECTORS (BNL ; BNL-49016(REV.))
Paper図書
CHEN, WEI// KRANER, H.W.// LI, ZHENG// REHAK, P.// HESS, F. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1994.
Other Libraries in Japan
  • Author HeadingCHEN, WEI KRANER, H.W. LI, ZHENG REHAK, P. HESS, F.

STUDY OF THE LONG TERM STABILITY OF THE EFFECTIVE CONCENTRATION OF IONIZED SPACE CHARGES (N/SUB EFF/) OF NEUTRON IRRADIATED SILICON DETECTORS FABRICATED BY VARIOUS THERMAL OXIDATIONS (BNL ; BNL-60294)

STUDY OF THE LONG TERM STABILITY OF THE EFFECTIVE CONCENTRATION OF IONIZED SPACE CHARGES (N/SUB EFF/) OF NEUTRON IRRADIATED SILICON DETECTORS FABRICATED BY VARIOUS THERMAL OXIDATIONS (BNL ; BNL-60294)
Paper図書
LI, Z.// CHEN, W.// KRANER, H.W.// EREMIN, V.// LINDSTROEM, G.// SPIRITI, E. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1994.
Other Libraries in Japan
  • Author HeadingLI, Z. CHEN, W. KRANER, H.W. EREMIN, V. LINDSTROEM, G. SPI...

FABRICATION OF LARGE AREA SI CYLINDRIC DRIFT DETECTORS (BNL ; BNL-49016)

FABRICATION OF LARGE AREA SI CYLINDRIC DRIFT DETECTORS (BNL ; BNL-49016)
Paper図書
CHEN, W.// KRANER, H.W.// LI, Z.// REHAK, P.// HESS, F. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
Other Libraries in Japan
  • Author HeadingCHEN, W. KRANER, H.W. LI, Z. REHAK, P. HESS, F.

INFLUENCE OF OXIDATION ON RADIATION HARDNESS OF SILICON DETECTORS (BNL ; BNL-60905)

INFLUENCE OF OXIDATION ON RADIATION HARDNESS OF SILICON DETECTORS (BNL ; BNL-60905)
Paper図書
KRANER, H.W.// LI, Z.// LAZANU, S.// BIGGERI, U.// BORCHI, E.// BRUZZI, M. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
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  • Author HeadingKRANER, H.W. LI, Z. LAZANU, S. BIGGERI, U....

MEASUREMENTS OF POSSIBLE TYPE INVERSION IN SILICON JUNCTION DETECTORS BY FAST NEUTRON IRRADIATION (BNL ; BNL-46210)

MEASUREMENTS OF POSSIBLE TYPE INVERSION IN SILICON JUNCTION DETECTORS BY FAST NEUTRON IRRADIATION (BNL ; BNL-46210)
Paper図書
LI, Z.// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (USA))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan
  • Author HeadingLI, Z. KRANER, H.W.

CHANGES IN ELECTRICAL PROPERTIES OF HIGH RESISTIVITY SILICON CAUSED BY FAST NEUTRON DAMAGE (BNL ; BNL-46198)

CHANGES IN ELECTRICAL PROPERTIES OF HIGH RESISTIVITY SILICON CAUSED BY FAST NEUTRON DAMAGE (BNL ; BNL-46198)
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan
  • Author HeadingLI, ZHENG KRANER, H.W.

STUDIES OF THE DEPENDENCE ON OXIDATION THERMAL PROCESSES OF EFFECTS ON THE ELECTRICAL PROPERTIES OF SILICON DETECTORS BY FAST NEUTRON RADIATION (BNL ; BNL-46086)

STUDIES OF THE DEPENDENCE ON OXIDATION THERMAL PROCESSES OF EFFECTS ON THE ELECTRICAL PROPERTIES OF SILICON DETECTORS BY FAST NEUTRON RADIATION (BNL ; BNL-46086)
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan
  • Author HeadingLI, ZHENG KRANER, H.W.

USE OF THE SIGNAL CURRENT PULSE SHAPE TO STUDY THE INTERNAL ELECTRIC FIELD PROFILE AND TRAPPING EFFECTS IN NEUTRON DAMAGED SILICON DETECTORS (BNL ; BNL-47506)

USE OF THE SIGNAL CURRENT PULSE SHAPE TO STUDY THE INTERNAL ELECTRIC FIELD PROFILE AND TRAPPING EFFECTS IN NEUTRON DAMAGED SILICON DETECTORS (BNL ; BNL-47506)
Paper図書
KRANER, H.W.// LI, Z.// FRETWURST, E. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1992.
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  • Author HeadingKRANER, H.W. LI, Z. FRETWURST, E.

APPLICATION OF THE RAPID THERMAL PROCESS: SINTERING THE SPUTTERED ALUMINUM/SILICON CONTACT IN SILICON DETECTOR FABRICATION (BNL ; BNL-46100)

APPLICATION OF THE RAPID THERMAL PROCESS: SINTERING THE SPUTTERED ALUMINUM/SILICON CONTACT IN SILICON DETECTOR FABRICATION (BNL ; BNL-46100)
Paper図書
CHEN, WEI// LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1991.
Other Libraries in Japan
  • Author HeadingCHEN, WEI LI, ZHENG KRANER, H.W.

IONIZING RADIATION EFFECTS ON SILICON TEST STRUCTURES (BNL ; BNL-49823)

IONIZING RADIATION EFFECTS ON SILICON TEST STRUCTURES (BNL ; BNL-49823)
Paper図書
KRANER, H.W.// BEUTTENMULLER, R.// CHEN, W.// KIERSTEAD, J.A.// LI, Z.// ZHANG, Y.// DOU, L.// FRETWURST, E.// LINDSTROEM, G. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
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  • Author HeadingKRANER, H.W. BEUTTENMULLER, R. CHEN, W. KI...

NEUTRON RADIATION DAMAGE STUDIES ON SILICON DETECTORS (BNL ; BNL-45381)

NEUTRON RADIATION DAMAGE STUDIES ON SILICON DETECTORS (BNL ; BNL-45381)
Paper図書
LI, ZHENG// CHEN, W.// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (USA))Brookhaven National Laboratory(Brookhaven National Laboratory)1990.
Other Libraries in Japan
  • Author HeadingLI, ZHENG CHEN, W. KRANER, H.W.

STUDIES OF FREQUENCY DEPENDENT C-V CHARACTERISTICS OF NEUTRON IRRADIATED P/SUP +/-N SILICON DETECTORS (BNL ; BNL-44648)

STUDIES OF FREQUENCY DEPENDENT C-V CHARACTERISTICS OF NEUTRON IRRADIATED P/SUP +/-N SILICON DETECTORS (BNL ; BNL-44648)
Paper図書
LI, ZHENG// KRANER, H.W. (BROOKHAVEN NATIONAL LAB., UPTON, NY (USA))Brookhaven National Laboratory(Brookhaven National Laboratory)1990.
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  • Author HeadingLI, ZHENG KRANER, H.W.

STUDIES OF DEEP LEVELS IN HIGH RESISTIVITY SILICON DETECTORS IRRADIATED BY HIGH FLUENCE FAST NEUTRONS USING A THERMALLY STIMULATED CURRENT SPECTROMETER (BNL ; BNL-49017)

STUDIES OF DEEP LEVELS IN HIGH RESISTIVITY SILICON DETECTORS IRRADIATED BY HIGH FLUENCE FAST NEUTRONS USING A THERMALLY STIMULATED CURRENT SPECTROMETER (BNL ; BNL-49017)
Paper図書
LI, Z.// KRANER, H.W.// CHEN, W.// BEUTTENMULLER, R.// BIGGERI, U.// BRUZZI, M.// BORCHI, E.// BALDINI, A.// SPILLANTINI, P. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1993.
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  • Author HeadingLI, Z. KRANER, H.W. CHEN, W. BEUTTENMULLER, R. BI...

FAST NEUTRON DAMAGE IN SILICON DETECTORS. (BNL ; BNL-41690)

FAST NEUTRON DAMAGE IN SILICON DETECTORS. (BNL ; BNL-41690)
Paper図書
KRANER, H.W.(et al.)Brookhaven National Laboratory(Brookhaven National Laboratory)1988.
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  • Author HeadingKRANER, H.W.
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