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Collaboration and technology : 21st international conference, CRIWG 2015 : Yerevan, Armenia, September 22-25, 2015 : proceedings : Sep 2015, Yerevan, Armenia. (Lecture Notes in Computer Science ; 9334)

Collaboration and technology : 21st international conference, CRIWG 2015 : Yerevan, Armenia, September 22-25, 2015 : proceedings : Sep 2015, Yerevan, Armenia. (Lecture Notes in Computer Science ; 9334)
Paper図書
Springer[2015]<M17-16-761>
National Diet Library
  • Author Heading...loian, Nelson. Zorian, Yervant. Taslakian, Perouz. Shoukoury...

2010 5th international design and test workshop : (IDT 2010) : Abu Dhabi, United Arab Emirates : 14-15 December 2010 : Dec 2010, Abu Dhabi, United Arab Emirates.

2010 5th international design and test workshop : (IDT 2010) : Abu Dhabi, United Arab Emirates : 14-15 December 2010 : Dec 2010, Abu Dhabi, United Arab Emirates.
Paper図書
IEEEc2010.<M17-12-3252>
National Diet Library
  • Author Heading...Arab Emirates) Zorian, Yervant.

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2002.<M17-03-393>
National Diet Library
  • Author Heading.... Wik, Thomas. Zorian, Yervant. IEEE International Workshop ...

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2001.<M17-03-2017>
National Diet Library
  • Author HeadingZorian, Yervant. IEEE International Workshop ...

Proceedings, IDT 2007 : the 2007 2nd International Design and Test Workshop

Proceedings, IDT 2007 : the 2007 2nd International Design and Test Workshop
Paper図書
edited by Yervant Zorian ... [et al.]IEEEc2007
Other Libraries in Japan
  • Author HeadingZorian, Yervant International Design and Test...

Embedded processor-based self-test

Embedded processor-based self-test
Paper図書
by Dimitris Gizopoulos, Antonis Paschalis and Yervant ZorianKluwer Academicc2004
Other Libraries in Japan
  • Author HeadingGizopoulos, Dimitris Paschalis, Antonis Zorian, Yervant

Principles of testing electronic systems

Principles of testing electronic systems
Paper図書
Samiha Mourad, Yervant ZorianJohn Wiley & Sonsc2000
Other Libraries in Japan
  • Author HeadingMourad, Samiha Zorian, Yervant

Multi-chip module test strategies acid-free paper

Multi-chip module test strategies acid-free paper
Paper図書
edited by Yervant ZorianKluwerc1997
Other Libraries in Japan
  • Author HeadingZorian, Yervant

On-line testing for VLSI alk. paper

On-line testing for VLSI alk. paper
Paper図書
edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. PradanKluwer Academic Publishersc1998
Other Libraries in Japan
  • Author HeadingNicolaidis, Michael Zorian, Yervant Pradan, Dhiraj K.

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker
Paper図書
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
Other Libraries in Japan
  • Author Heading...k, T. (Thomas) Zorian, Yervant IEEE Computer Society IEEE Co...

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA : case
Paper図書
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits SocietyIEEE Computer Societyc2001
Other Libraries in Japan
  • Author Heading...n, and Testing Zorian, Yervant Courtois, B. (Bernard) Wik, T...

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