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LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究
LSI歩留まり向上のための誤テスト回避型テスト方式に関する研究
Paper
図書
温暁青, 九州工業大学 [著]
[温暁青]
2005-2006
<Y151-H17500039>
National Diet Library
Subject Heading
LSIテスト / スキャン設計 / 低消費電力テスト / IRドロップ
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