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2013 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 November 2013 : Beijing, China : OIT 2013 : Nov 2013, Beijing, China. (SPIE Proceedings ; 9046)

2013 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 November 2013 : Beijing, China : OIT 2013 : Nov 2013, Beijing, China. (SPIE Proceedings ; 9046)
Paper図書
SPIE[2013]<M17-14-2321>
National Diet Library

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)
Paper図書
SPIE[2015]<M17-16-75>
National Diet Library

2011 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8201)

2011 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8201)
Paper図書
SPIEc2011.<M17-12-2567>
National Diet Library

2008 international conference on optical instruments and technology : optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China. : OIT'08 : Nov 2008, Beijing, China. (SPIE Proceedings ; 7160)

2008 international conference on optical instruments and technology : optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China. : OIT'08 : Nov 2008, Beijing, China. (SPIE Proceedings ; 7160)
Paper図書
SPIEc2009.<M17-09-1541>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingOptical measurements -- Industrial applications -- Congresses. Optoelectronic devices -- Con...

2009 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 19-22 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7511)

2009 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 19-22 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7511)
Paper図書
SPIEc2009.<M17-10-1973>
National Diet Library
  • Subject HeadingOptical measurements -- Industrial applications -- Congresses. Optoelectronic devices -- Con...

Optical micro- and nanometrology in manufacturing technology : 29-30 April 2004 : Strasbourg, France. : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5458)

Optical micro- and nanometrology in manufacturing technology : 29-30 April 2004 : Strasbourg, France. : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5458)
Paper図書
SPIEc2004.<M17-04-3367>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingOptical measurements -- Industrial applications -- Congresses. Online resources.

Optical metrology in production engineering : 27-30 April 2004 : Strasbourg, France. : photonics Europe : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5457)

Optical metrology in production engineering : 27-30 April 2004 : Strasbourg, France. : photonics Europe : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5457)
Paper図書
SPIEc2004.<M17-04-3509>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingOptical measurements -- Industrial applications -- Congresses. Production engineering -- Con...

Ninth international symposium on laser metrology : 30 June-2 July 2008 : Singapore. : LM2008 : Jun 2008, Singapore. (SPIE Proceedings ; 7155)

Ninth international symposium on laser metrology : 30 June-2 July 2008 : Singapore. : LM2008 : Jun 2008, Singapore. (SPIE Proceedings ; 7155)
Paper図書
SPIEc2008.<M17-09-388>
National Diet Library
  • Subject HeadingMeasurement -- Congresses. Optical measurements -- Industrial applications -- Congresses. Lasers -- Industrial applicat...

Optical micro- and nanometrology in microsystems technology 2 : 8-10 April 2008 : Strasbourg, France. : Apr 2008, Strasbourg, France. (SPIE Proceedings ; 6995)

Optical micro- and nanometrology in microsystems technology 2 : 8-10 April 2008 : Strasbourg, France. : Apr 2008, Strasbourg, France. (SPIE Proceedings ; 6995)
Paper図書
SPIEc2008.<M17-08-1739>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingOptical measurements -- Industrial applications -- Congresses. Optical measurements -- Congr...

Seventh international symposium on laser metrology applied to science, industry, and everyday life : 9-13 September 2002 : Novosibirsk, Russia. : Sep 2002, Novosibirsk, Russia. (SPIE Proceedings ; 4900)

Seventh international symposium on laser metrology applied to science, industry, and everyday life : 9-13 September 2002 : Novosibirsk, Russia. : Sep 2002, Novosibirsk, Russia. (SPIE Proceedings ; 4900)
Paper図書
SPIEc2002.<M17-03-4389>
National Diet Library
  • Subject HeadingMensuration -- Congresses. Optical measurements -- Industrial applications -- Congresses. Lasers -- Industrial applicat...

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)
Paper図書
SPIEc2003.<M17-04-1394>
National Diet LibraryOther Libraries in Japan
  • Subject Heading...-- Congresses. Optical measurements -- Industrial applications -- Congresses. Optical instruments -- Design...

Optical metrology roadmap for the semiconductor, optical, and data storage industries 2 : 2-3 August 2001 : San Diego, USA. : 46th annual SPIE international symposium on optical science and technology : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4449)

Optical metrology roadmap for the semiconductor, optical, and data storage industries 2 : 2-3 August 2001 : San Diego, USA. : 46th annual SPIE international symposium on optical science and technology : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4449)
Paper図書
SPIEc2001.<M17-03-3089>
National Diet Library
  • Subject HeadingOptical measurements -- Industrial applications -- Congresses. Surfaces (Technology) -- Meas...

Recent developments in traceable dimensional measurements : 20-21 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4401)

Recent developments in traceable dimensional measurements : 20-21 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4401)
Paper図書
SPIEc2001.<M17-03-2954>
National Diet LibraryOther Libraries in Japan
  • Subject Heading...-- Congresses. Optical measurements -- Industrial applications -- Congresses. Optical instruments -- Design...

Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico

Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
Paper図書
R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG
Paper図書
Christophe Gorecki, chair/editor ; sponsored by EOS--The European Optical Society, SPIE--The International Society for Optical Engineering, the Commission of the European Communities, Directorate General for Science, Research, and DevelopmentSPIEc1997
Other Libraries in Japan

Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG

Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG
Paper図書
Christophe Gorecki, Richard W. T. Preater, chairs/editors ; sponsored by the Commission of the European Communities, Directorate General for Science, Research and Development, EOS--the European Optical Society, [and] SPIE--the International Society for Optical EngineeringSPIE--the International Society for Optical Engineering1994
Other Libraries in Japan

Proceedings optical sensing for environmental and process monitoring : 7-10 November 1994, McLean, Virginia

Proceedings optical sensing for environmental and process monitoring : 7-10 November 1994, McLean, Virginia
Paper図書
Air & Waste Management Associationc1995
Other Libraries in Japan

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