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2015 IEEE 24th North Atlantic test workshop : (NATW 2015) : Johnson City, New York, USA : 11-13 May 2015 : NATW 2015 conference : May 2015, Johnson CIty, NY.

2015 IEEE 24th North Atlantic test workshop : (NATW 2015) : Johnson City, New York, USA : 11-13 May 2015 : NATW 2015 conference : May 2015, Johnson CIty, NY.
Paper図書
IEEE[2015]<M17-17-1931>
National Diet Library

2016 IEEE 8th international memory workshop : (IMW 2016) : Paris, France : 15-18 May 2016 : May 2016, Paris, France.

2016 IEEE 8th international memory workshop : (IMW 2016) : Paris, France : 15-18 May 2016 : May 2016, Paris, France.
Paper図書
IEEE[2016]<M17-17-2464>
National Diet Library

2015 IEEE international memory workshop : (IMW 2015) : Monterey, California, USA : 17-20 May 2015 : 2015 IEEE 7th international memory workshop : May 2015, Monterey, CA.

2015 IEEE international memory workshop : (IMW 2015) : Monterey, California, USA : 17-20 May 2015 : 2015 IEEE 7th international memory workshop : May 2015, Monterey, CA.
Paper図書
IEEE[2015]<M17-17-1360>
National Diet Library

2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.

2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.
Paper図書
IEEEc2009.<M17-11-564>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Congresses.

2014 IEEE 23rd North Atlantic test workshop : (NATW 2014) : Johnson City, New York, USA : 14-16 May 2014 : May 2014, Johnson City, NY.

2014 IEEE 23rd North Atlantic test workshop : (NATW 2014) : Johnson City, New York, USA : 14-16 May 2014 : May 2014, Johnson City, NY.
Paper図書
IEEE[2014]<M17-15-2207>
National Diet Library

2016 IEEE 25th North Atlantic test workshop (NATW 2016) : Providence, Rhode Island, USA : 9-11 May 2016 : May 2016, Providence, RI.

2016 IEEE 25th North Atlantic test workshop (NATW 2016) : Providence, Rhode Island, USA : 9-11 May 2016 : May 2016, Providence, RI.
Paper図書
IEEE[2016]<M17-18-1582>
National Diet Library

2013 5th IEEE international memory workshop : (IMW 2013) : Monterey, California, USA : 26-29 May 2013 : May 2013, Monterey, CA.

2013 5th IEEE international memory workshop : (IMW 2013) : Monterey, California, USA : 26-29 May 2013 : May 2013, Monterey, CA.
Paper図書
IEEE[2013]<M17-14-2710>
National Diet Library

Proceedings of technical program of 2012 VLSI technology, system and application : (VLSI-TSA 2012) : Hsinchu, Taiwan : 23-25 April 2012 : 2012 international symposium on VLSI technology, systems and applications : VLSI-TSA and VLSI-DAT conferences : Apr 2012, Hsinchu, Taiwan.

Proceedings of technical program of 2012 VLSI technology, system and application : (VLSI-TSA 2012) : Hsinchu, Taiwan : 23-25 April 2012 : 2012 international symposium on VLSI technology, systems and applications : VLSI-TSA and VLSI-DAT conferences : Apr 2012, Hsinchu, Taiwan.
Paper図書
IEEEc2012.<M17-13-17>
National Diet Library

2015 international symposium on VLSI technology, systems and applications : (VLSI-TSA 2015) : Hsinchu, Taiwan : 27-29 April 2015 : Apr 2015, Hsinchu, Taiwan.

2015 international symposium on VLSI technology, systems and applications : (VLSI-TSA 2015) : Hsinchu, Taiwan : 27-29 April 2015 : Apr 2015, Hsinchu, Taiwan.
Paper図書
IEEE[2015]<M17-17-2067>
National Diet Library

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.
Paper図書
IEEE Computer Societyc2004.<M17-05-431>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing. -- Congresses. Random access memory -- Congresses.

2014 international symposium on VLSI technology, systems and applications : (VLSI-TSA 2014) : Hsinchu, Taiwan : 28-30 April 2014 : Apr 2014, Hsinchu, Taiwan.

2014 international symposium on VLSI technology, systems and applications : (VLSI-TSA 2014) : Hsinchu, Taiwan : 28-30 April 2014 : Apr 2014, Hsinchu, Taiwan.
Paper図書
IEEE[2014]<M17-15-2217>
National Diet Library

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2003.<M17-04-1660>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing. -- Congresses. Random access memory -- Congresses.

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2002.<M17-03-393>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Congresses.

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2001.<M17-03-2017>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Congresses.

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
Paper図書
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua UniversityIEEE Computer Societyc2005
Other Libraries in Japan

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA
Paper図書
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2004
Other Libraries in Japan

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker
Paper図書
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
Other Libraries in Japan

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA
Paper図書
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]IEEE Computer Society Pressc1998
Other Libraries in Japan

Proceedings : International Workshop on Memory Technology, Design, and Testing

Proceedings : International Workshop on Memory Technology, Design, and Testing
Paper図書
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997
Other Libraries in Japan

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore
Paper図書
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1996
Other Libraries in Japan
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