「"IEEE Philadelphia Section"」の検索結果 | NDLサーチ

検索結果 48 件

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2001 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : revolutionary ideas in test : soft.

紙図書

sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Philadelphia SectionIEEE Service Centerc2001

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著者標目...rement Society IEEE Philadelphia Section

Proceedings of the 2004 IEEE Radar Conference, April 26-29, 2004, Wyndham Franklin Hotel, Philadelphia, Pennsylvania

紙図書

sponsored by IEEE Philadelphia Section, IEEE Aerospace and Electronic Systems SocietyIEEE Operations Centerc2004

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Proceedings : International Test Conference 2004

紙図書

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2004

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Board and system test track

紙図書

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2003

全国の図書館

Proceedings : International Test Conference 2003

紙図書

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2003

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Proceedings : International Test Conference 1999 : soft : case : microfiche

紙図書

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]International Test Conferencec1999

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International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

紙図書

sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2002

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Proceedings : International Test Conference 1998 : soft : case : microfiche

紙図書

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1998

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International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

紙図書

sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2001

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Proceedings : International Test Conference 1997 : soft : case :microfiche :CD-ROM

紙図書

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1997

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Proceedings : International Test Conference 1996 : soft : case :microfiche :CD-ROM

紙図書

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1996

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Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche

紙図書

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2000

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Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

紙図書

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia SectionIEEE Computer Societyc1998

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Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California : pbk

紙図書

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia SectionIEEE Computer Society Pressc1997

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Proceedings : International Test Conference 1993 : soft : case

紙図書

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]International Test Conferencec1993

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Proceedings : International Test Conference 1992 : soft. : case. : micro.

紙図書

[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]International Test Conferencec1992

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Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey

紙図書

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia SectionIEEE Computer Society Pressc1996

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13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings pbk.

紙図書

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia SectionIEEE Computer Society Pressc1995

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Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis, October 25-28, 1994, Philadelphia, Pennsylvania

紙図書

sponsored by the IEEE Signal Processing Society and then IEEE Philadelphia SectionInstitute of Electrical and Electronics Engineersc1994

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12th IEEE VLSI Test Symposium : proceedings, April 25-28, 1994, Cherry Hill, New Jersey : pbk

紙図書

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia SectionIEEE Computer Society Pressc1994

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