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16th VLSI test symposium : Apr 1998, Monterey, CA.

16th VLSI test symposium : Apr 1998, Monterey, CA.
紙図書
IEEE Computer Society Press1998.<M17-99-0575>
国立国会図書館
  • 著者標目...st Technology. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Industrial and commercial power systems Technical conference : May 1997, Philadelphia, PA.

Industrial and commercial power systems Technical conference : May 1997, Philadelphia, PA.
マイクロ図書
IEEE1997.<M17-98-0278-LS>
国立国会図書館
  • 著者標目...ms Department. Institute of Electrical and Electronics Engineers. Philadelphia Section.

14th VLSI test symposium : Apr 1996, Princeton, NJ.

14th VLSI test symposium : Apr 1996, Princeton, NJ.
紙図書
IEEE Computer Society Press1996.<M17-96-2324>
国立国会図書館
  • 著者標目...st Technology. Institute of Electrical and Electronics Engineers. Philadelphia Section.

VLSI test : 13th Symposium : Apr 1995, Princeton, NJ.

VLSI test : 13th Symposium : Apr 1995, Princeton, NJ.
紙図書
IEEE Computer Society Press1995.<M17-97-2046>
国立国会図書館
  • 著者標目...st Technology. Institute of Electrical and Electronics Engineers. Philadelphia Section.

VLSI test : 12th Symposium : Apr 1994, Cherry Hill, NJ.

VLSI test : 12th Symposium : Apr 1994, Cherry Hill, NJ.
紙図書
IEEE Computer Society Pressc1994.<M17-95-0347>
国立国会図書館
  • 著者標目...st Technology. Institute of Electrical and Electronics Engineers. Philadelphia Section.

25th International test conference Oct 1994, Washington, DC.

25th International test conference Oct 1994, Washington, DC.
マイクロ図書
IEEE1994.<M17-95-1333-LS>
国立国会図書館
  • 著者標目...cal Committee. Institute of Electrical and Electronics Engineers. Philadelphia Section.

VLSI test : 10th Anniversary symposium : Apr 1992, Atlantic City, NJ.

VLSI test : 10th Anniversary symposium : Apr 1992, Atlantic City, NJ.
紙図書
IEEE1992.<M17-94-0785>
国立国会図書館
  • 著者標目...cal Committee. Institute of Electrical and Electronics Engineers. Philadelphia Section.

International test conference Sep 1992, Baltimore, MD.

International test conference Sep 1992, Baltimore, MD.
マイクロ図書
IEEE1992.<M17-94-0938-LS>
国立国会図書館
  • 著者標目...cal Committee. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Intelligent control and adaptive systems : Conference : Nov 1989, Philadelphia, PA. (SPIE Proceedings ; 1196)

Intelligent control and adaptive systems : Conference : Nov 1989, Philadelphia, PA. (SPIE Proceedings ; 1196)
紙図書
SPIE1990.<M17-90-1204>
国立国会図書館
  • 著者標目...l Engineering. Institute of Electrical and Electronics Engineers. Philadelphia Section.

VLSI test : 9th Symposium : Apr 1991, Atlantic City, NJ.

VLSI test : 9th Symposium : Apr 1991, Atlantic City, NJ.
紙図書
IEEE1991.<M17-94-0805>
国立国会図書館
  • 著者標目...cal Committee. Institute of Electrical and Electronics Engineers. Philadelphia Section.

The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.

The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.
マイクロ図書
IEEE Computer Society Press1990.<M17-92-0701-LS>
国立国会図書館
  • 著者標目...cal Committee. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Optics, illumination, and image sensing for machine vision 4 : 4th Conference : Nov 1989, Philadelphia, PA. (SPIE Proceedings ; 1194)

Optics, illumination, and image sensing for machine vision 4 : 4th Conference : Nov 1989, Philadelphia, PA. (SPIE Proceedings ; 1194)
紙図書
SPIE1990.<M17-90-1402>
国立国会図書館
  • 著者標目...l Engineering. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Automated inspection and high-speed vision architectures 3 : Conference : Nov 1989, Philadelphia, PA. (SPIE Proceedings ; 1197)

Automated inspection and high-speed vision architectures 3 : Conference : Nov 1989, Philadelphia, PA. (SPIE Proceedings ; 1197)
紙図書
SPIE1990.<M17-90-1205>
国立国会図書館
  • 著者標目...l Engineering. Institute of Electrical and Electronics Engineers. Philadelphia Section.

Proceedings of the 2004 IEEE Radar Conference, April 26-29, 2004, Wyndham Franklin Hotel, Philadelphia, Pennsylvania

Proceedings of the 2004 IEEE Radar Conference, April 26-29, 2004, Wyndham Franklin Hotel, Philadelphia, Pennsylvania
紙図書
sponsored by IEEE Philadelphia Section, IEEE Aerospace and Electronic Systems SocietyIEEE Operations Centerc2004
全国の図書館
  • 著者標目...dar Conference Institute of Electrical and Electronics Engineers. Philadelphia Section IEEE Aerospace and Electronic...

Proceedings : International Test Conference 2004

Proceedings : International Test Conference 2004
紙図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2004
全国の図書館
  • 著者標目...hnical Council Institute of Electrical and Electronics Engineers. Philadelphia Section

Proceedings : International Test Conference 2003

Proceedings : International Test Conference 2003
紙図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2003
全国の図書館
  • 著者標目...hnical Council Institute of Electrical and Electronics Engineers. Philadelphia Section

Board and system test track

Board and system test track
紙図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2003
全国の図書館
  • 著者標目...hnical Council Institute of Electrical and Electronics Engineers. Philadelphia Section

New frontiers in testing : International test conference : Sep 1988, Washington, DC.

New frontiers in testing : International test conference : Sep 1988, Washington, DC.
紙図書
Institute of Electrical and Electronics Engineers1988.<M17-89-0275>
国立国会図書館
  • 著者標目...cal Committee. Institute of Electrical and Electronics Engineers. Philadelphia Section.

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
紙図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2002
全国の図書館
  • 著者標目...hnical Council Institute of Electrical and Electronics Engineers. Philadelphia Section

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
紙図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2001
全国の図書館
  • 著者標目...hnical Council Institute of Electrical and Electronics Engineers. Philadelphia Section
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