「"Quality control -- Optical methods -- Automation -- Congresses."」の検索結果 | NDLサーチ

検索結果 29 件

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Image processing: machine vision applications 6 : 5-6 February 2013 : Burlingame, California, United States : Feb 2013, Burlingame, CA. (SPIE Proceedings ; 8661)

紙図書

SPIEc2013.<M17-14-68>

国立国会図書館

Image processing: machine vision applications 5 : 25 January 2012 : Burlingame, California, United States : Jan 2012, Burlingame, CA. (SPIE Proceedings ; 8300)

紙図書

SPIEc2012.<M17-12-3325>

国立国会図書館

Image processing: machine vision applications 4 : 25-27 January 2011 : San Francisco, California, United States. : Jan 2011, San Francisco, CA. (SPIE Proceedings ; 7877)

紙図書

SPIEc2011.<M17-11-2266>

国立国会図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Electronic books.

Image processing: machine vision applications VIII : 10-11 February 2015 : San Francisco, California, United States : Feb 2015, San Francisco, CA. (SPIE Proceedings ; 9405)

紙図書

SPIE[2015]<M17-15-2815>

国立国会図書館

Image processing: machine vision applications 3 : 19-21 January 2010 : San Jose, California, United States. : Jan 2010, San Jose, CA. (SPIE Proceedings ; 7538)

紙図書

SPIEc2010.<M17-10-2515>

国立国会図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Electronic books.

Image processing: machine vision applications : 29-31 January 2008 : San Jose, California, USA. : Jan 2008, San Jose, CA. (SPIE Proceedings ; 6813)

紙図書

SPIEc2008.<M17-08-1151>

国立国会図書館全国の図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses.

Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6503)

紙図書

SPIEc2007.<M17-07-1317>

国立国会図書館全国の図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Measurement -- Congresses.

Machine vision applications in industrial inspection 14 : 16-17 January 2006 : San Jose, California, USA. : Jan 2006, San Jose, CA. (SPIE Proceedings ; 6070)

紙図書

SPIEc2006.<M17-06-1192>

国立国会図書館全国の図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Mensuration. -- Congresses.

Machine vision applications in industrial inspection 12 : 21-22 January 2004 : San Jose, California, USA. : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5303)

紙図書

SPIEc2004.<M17-04-2557>

国立国会図書館全国の図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Mensuration. -- Congresses.

Machine vision applications in industrial inspection 11 : 22-24 January 2003 : Santa Clara, California, USA. : Jan 2003, Santa Clara, CA. (SPIE Proceedings ; 5011)

紙図書

SPIEc2003.<M17-03-5242>

国立国会図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Mensuration. -- Congresses.

Machine vision applications in industrial inspection 10 : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4664)

紙図書

SPIEc2002.<M17-03-3360>

国立国会図書館全国の図書館

件名...-- Congresses. Quality control -- Optical methods -- Automation -- Congresses. Mensuration -- Congresses.

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

紙図書

Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2003

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Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

紙図書

Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1999

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Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

紙図書

Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc2000

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Machine vision applications in industrial inspection III : 8-9 February 1995, San Jose, California

紙図書

Frederick Y. Wu, Stephen S. Wilson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1995

全国の図書館

Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California

紙図書

A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical EngineeringSPIEc1998

全国の図書館

Machine vision applications in industrial inspection II : 8-9 February 1994, San Jose, California pbk.

紙図書

Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1994

全国の図書館

Machine vision applications in industrial inspection V : 10-11 February, 1997, San Jose, California

紙図書

A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical EngineeringSPIEc1997

全国の図書館

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

紙図書

Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]SPIEc1998

全国の図書館

Machine vision applications in industrial inspection : 3-4 February 1993, San Jose, California

紙図書

Frederick Y. Wu, Benjamin M. Dawson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical EngineeringSPIEc1993

全国の図書館

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