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2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.

2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.
紙図書
IEEEc2012.<M17-12-3881>
国立国会図書館

2011 IEEE international conference on microelectronic test structures : (ICMTS 2011) : Amsterdam, Netherlands : 4-7 April 2011 : Apr 2011, Amsterdam, the Netherlands.

2011 IEEE international conference on microelectronic test structures : (ICMTS 2011) : Amsterdam, Netherlands : 4-7 April 2011 : Apr 2011, Amsterdam, the Netherlands.
紙図書
IEEEc2011.<M17-12-1601>
国立国会図書館

2015 international conference on microelectronic test structures : (ICMTS 2015) : Tempe, Arizona, USA : 23-26 March 2015 : 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.

2015 international conference on microelectronic test structures : (ICMTS 2015) : Tempe, Arizona, USA : 23-26 March 2015 : 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.
紙図書
IEEE[2015]<M17-15-3236>
国立国会図書館

2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.

2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.
紙図書
IEEEc2010.<M17-11-2929>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

2009 IEEE international conference on microelectronic test structures : ICMTS 2009 : Embassy Suites : Mandalay Beach Hotel : Oxnard, CA : March 30-April 2, 2009. : 22nd annual ICMTS : Mar 2009, Oxnard, CA.

2009 IEEE international conference on microelectronic test structures : ICMTS 2009 : Embassy Suites : Mandalay Beach Hotel : Oxnard, CA : March 30-April 2, 2009. : 22nd annual ICMTS : Mar 2009, Oxnard, CA.
紙図書
IEEEc2009.<M17-10-4024>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

2008 IEEE international conference on microelectronic test structures : conference proceedings : March 24-27 : the University of Edinburgh, UK. : Mar 2008, Edinburgh, UK.

2008 IEEE international conference on microelectronic test structures : conference proceedings : March 24-27 : the University of Edinburgh, UK. : Mar 2008, Edinburgh, UK.
紙図書
IEEEc2008.<M17-09-1000>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.

2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.
紙図書
IEEEc2005.<M17-10-182>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronics -- Congresses.

2012 IEEE international test conference : (ITC 2012) : Anaheim, California, USA : 5-8 November 2012 : ITC's lecture : Nov 2012, Anaheim, CA. CFP12ITC-ART

2012 IEEE international test conference : (ITC 2012) : Anaheim, California, USA : 5-8 November 2012 : ITC's lecture : Nov 2012, Anaheim, CA. CFP12ITC-ART
紙図書
IEEEc2012.<M17-13-2704>
国立国会図書館

ICMTS 2006 : proceedings of the 2006 international conference on microelectronic test structures : Hyatt on Town Lake : Austin, Texas : March 6-9, 2006. : 19th annual ICMTS : Mar 2006, Austin, TX.

ICMTS 2006 : proceedings of the 2006 international conference on microelectronic test structures : Hyatt on Town Lake : Austin, Texas : March 6-9, 2006. : 19th annual ICMTS : Mar 2006, Austin, TX.
紙図書
IEEEc2006.<M17-07-1509>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.

2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.
紙図書
IEEE[2016]<M17-18-1579>
国立国会図書館

ICMTS 2004 : proceedings of the 2004 international conference on microelectronic test structures : March 22-25, 2004 : Awaji Yumebutai International Conference Center, Japan. : 17th ICMTS : Mar 2004, Higashiura-cho, Japan.

ICMTS 2004 : proceedings of the 2004 international conference on microelectronic test structures : March 22-25, 2004 : Awaji Yumebutai International Conference Center, Japan. : 17th ICMTS : Mar 2004, Higashiura-cho, Japan.
紙図書
IEEEc2004.<M17-04-3497>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

ICMTS 2003 : proceedings of the 2003 international conference on microelectronic test structures : March 17-20, 2003 : DoubleTree Hotel Monterey, California. : Mar 2003, Monterey, CA.

ICMTS 2003 : proceedings of the 2003 international conference on microelectronic test structures : March 17-20, 2003 : DoubleTree Hotel Monterey, California. : Mar 2003, Monterey, CA.
紙図書
IEEEc2003.<M17-04-254>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures : April 8-11, 2002 : Cork, Ireland. : 15th ICMTS : Apr 2002, Cork, Ireland.

ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures : April 8-11, 2002 : Cork, Ireland. : 15th ICMTS : Apr 2002, Cork, Ireland.
紙図書
IEEEc2002.<M17-03-1788>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

ICMTS 2001 : proceedings of the 2001 international conference on microelectronic test structures : March 19-22, 2001 : Kobe, Japan. Mar 2001, Kobe, Japan.

ICMTS 2001 : proceedings of the 2001 international conference on microelectronic test structures : March 19-22, 2001 : Kobe, Japan. Mar 2001, Kobe, Japan.
マイクロ図書
IEEEc2001.<M17-LS-03-9>
国立国会図書館
  • 件名...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic apparatus and app...

Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman/editor. (Proceedings of SPIE--the International Society for Optical Engineering ; v. 524)

Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman/editor. (Proceedings of SPIE--the International Society for Optical Engineering ; v. 524)
紙図書
SPIE--the International Society for Optical Engineeringc1985.<M15-A1320>
国立国会図書館
  • 件名Semiconductors -- Testing -- Congresses. Spectrum analysis -- Congres...

Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts / Fred H. Pollak, Robert S. Bauer, chairmen/editors. (Proceedings of SPIE--the International Society for Optical Engineering ; v. 452)

Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts / Fred H. Pollak, Robert S. Bauer, chairmen/editors. (Proceedings of SPIE--the International Society for Optical Engineering ; v. 452)
紙図書
SPIE--International Society for Optical Engineeringc1984.<M15-A2112>
国立国会図書館
  • 件名Semiconductors -- Testing -- Congresses. Spectrum analysis -- Congres...

RADC/NBS workshop, moisture measurement and control for semiconductor devices, III / Benjamin A. Moore and Stanley Ruthberg, editors : sponsored by Rome Air Development Center and National Bureau of Standards (NBSIR ; 84-2852)

RADC/NBS workshop, moisture measurement and control for semiconductor devices, III / Benjamin A. Moore and Stanley Ruthberg, editors : sponsored by Rome Air Development Center and National Bureau of Standards (NBSIR ; 84-2852)
マイクロ図書
1984<YCA-C 13.58:84-2852>
国立国会図書館
  • 件名Moisture -- Measurement -- Congresses Semiconductors -- Testing -- Congresses

Nondestructive evaluation of semiconductor materials and devices : [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978] / edited by Jay N. Zemel. (NATO advanced study institutes series : Series B, Physics ; v. 46)

Nondestructive evaluation of semiconductor materials and devices : [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978] / edited by Jay N. Zemel. (NATO advanced study institutes series : Series B, Physics ; v. 46)
紙図書
Plenum Pressc1979.<ND371-66>
国立国会図書館
  • 件名Semiconductors -- Testing -- Congresses.

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
紙図書
editors, P. Rai-Choudhury ... [et al.]Electrochemical Societyc1997
全国の図書館
  • 件名Semiconductors -- Testing -- Congresses
  • 件名（識別子）Semiconductors -- Testing -- Congresses

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices / edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C. L. Anderson ... [et al. ; sponsored by] Elecronics Division. (Proceedings - The Electrochemical Society ; v. 78-3)

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices / edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C. L. Anderson ... [et al. ; sponsored by] Elecronics Division. (Proceedings - The Electrochemical Society ; v. 78-3)
紙図書
Electrochemical Societyc1978.<ND371-60>
国立国会図書館
  • 件名Semiconductors -- Testing -- Congresses.
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