本文に飛ぶ

年 〜
年

検索結果 22 件

Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)

Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)
紙図書
SPIEc2012.<M17-13-1001>
国立国会図書館

Pavement surface condition/performance assessment: reliability and relevancy of procedures and technologies. : ASTM International symposium on pavement condition assessment : Dec 2004, Washington, DC. (STP ; 1486)

Pavement surface condition/performance assessment: reliability and relevancy of procedures and technologies. : ASTM International symposium on pavement condition assessment : Dec 2004, Washington, DC. (STP ; 1486)
紙図書
ASTM Internationalc2007.<M17-07-1579>
国立国会図書館
  • 件名...-- Congresses. Surface roughness -- Measurement -- Congresses.

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)

Reflection, scattering, and diffraction from surfaces : 11-12 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7065)
紙図書
SPIEc2008.<M17-09-192>
国立国会図書館全国の図書館
  • 件名Surface roughness -- Measurement -- Congresses. Diffractive sc...

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)

Surface scattering and diffraction 3 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5189)
紙図書
SPIEc2003.<M17-04-934>
国立国会図書館
  • 件名Surface roughness -- Measurement. -- Congresses. Diffractive s...

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)

Surface scattering and diffraction for advanced metrology 2 : 9 July, 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4780)
紙図書
SPIEc2002.<M17-03-635>
国立国会図書館
  • 件名Surface roughness -- Measurement. -- Congresses. Diffractive s...

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)

Surface scattering and diffraction for advanced metrology : 1 August 2001 : San Diego, USA. : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4447)
紙図書
SPIEc2001.<M17-03-4990>
国立国会図書館
  • 件名Surface roughness -- Measurement -- Congresses. Diffractive sc...

Fractal analysis in machining pbk.

Fractal analysis in machining pbk.
紙図書
Prasanta Sahoo, Tapan Barman, Joõ Paulo DavimSpringerc2011
全国の図書館
  • 件名Surface roughness -- Measurement Fractals Machining
  • 件名（識別子）Surface roughness -- Measurement Fractals Machining

Introduction to surface roughness and scattering 2nd. ed.

Introduction to surface roughness and scattering 2nd. ed.
紙図書
Jean M. Bennett, Lars MattssonOptical Society of Americac1999
全国の図書館
  • 件名Surface roughness -- Measurement Light -- Scattering
  • 件名（識別子）Surface roughness -- Measurement Light -- Scattering

Pavement surface condition/performance assessment : reliability and relevancy of procedures and technologies

Pavement surface condition/performance assessment : reliability and relevancy of procedures and technologies
紙図書
Bouzid Choubane, editorASTM Internationalc2007
全国の図書館
  • 件名... -- Congresses Surface roughness -- Measurement -- Congresses
  • 件名（識別子）... -- Congresses Surface roughness -- Measurement -- Congresses

Development of methods for the characterisation of roughness in three dimensions Revised reprint

Development of methods for the characterisation of roughness in three dimensions Revised reprint
紙図書
edited by K.J. StoutPenton Pressc2000
全国の図書館
  • 件名Surface roughness -- Measurement -- Methodology
  • 件名（識別子）Surface roughness -- Measurement -- Methodology

Introduction to surface roughness and scattering

Introduction to surface roughness and scattering
紙図書
Jean M. Bennett, Lars MattssonOptical Society of Americac1989
全国の図書館
  • 件名Surface roughness -- Measurement Light -- Scattering
  • 件名（識別子）Surface roughness -- Measurement Light -- Scattering

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA
紙図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2000
全国の図書館
  • 件名Surface roughness -- Measurement Congresses Light -- Scatterin...
  • 件名（識別子）Surface roughness -- Measurement Congresses Light -- Scatterin...

Measurement of pavement surface condition, 1990

Measurement of pavement surface condition, 1990
紙図書
Transportation Research Board, National Research Council1990
全国の図書館
  • 件名... -- Management Surface roughness -- Measurement
  • 件名（識別子）... -- Management Surface roughness -- Measurement

Scattering and surface roughness II : 21-23 July 1998, San Diego, California

Scattering and surface roughness II : 21-23 July 1998, San Diego, California
紙図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1998
全国の図書館
  • 件名Surface roughness -- Measurement Congresses Light -- Scatterin...
  • 件名（識別子）Surface roughness -- Measurement Congresses Light -- Scatterin...

The international road roughness experiment : establishing correlation and a calibration standard for measurements pbk.

The international road roughness experiment : establishing correlation and a calibration standard for measurements pbk.
紙図書
Michael W. Sayers, Thomas D. Gillespie, and Cesar A.V. QueirozWorld Bankc1986
全国の図書館
  • 件名Roads -- Riding qualities -- Measurement Surface roughness -- Measurement
  • 件名（識別子）Roads -- Riding qualities -- Measurement Surface roughness -- Measurement

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California
紙図書
John C. Stover, chair/editorSponsored and published by SPIE-The International Society for Optical Engineeringc1998
全国の図書館
  • 件名... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...
  • 件名（識別子）... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...

Pavement roughness and skid resistance

Pavement roughness and skid resistance
紙図書
Transportation Research Board, National Research Council1986
全国の図書館
  • 件名Roads -- Riding qualities Surface roughness -- Measurement Pavements -- Skid resistance
  • 件名（識別子）Roads -- Riding qualities Surface roughness -- Measurement Pavements -- Skid resistance

Scattering and surface roughness : 30-31 July 1997, San Diego, California

Scattering and surface roughness : 30-31 July 1997, San Diego, California
紙図書
Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1997
全国の図書館
  • 件名Surface roughness -- Measurement -- Congresses Light -- Scatte...
  • 件名（識別子）Surface roughness -- Measurement -- Congresses Light -- Scatte...

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado
紙図書
John C. Stover, chair/editorSPIE-The International Society for Optical Engineeringc1996
全国の図書館
  • 件名... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...
  • 件名（識別子）... -- Congresses Surface roughness -- Measurement -- Congresses Flatness measur...

Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany

Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany
紙図書
Jean M. Bennett chair editor ; sponsored by EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical EngineeringSPIE--the International Society for Optical Engineeringc1989
全国の図書館
  • 件名Surface roughness -- Measurement -- Congresses Surfaces (Techn...
  • 件名（識別子）Surface roughness -- Measurement -- Congresses Surfaces (Techn...
RSS