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Studies on defect level and diagnosis for built-in self test architecture

Studies on defect level and diagnosis for built-in self test architecture
デジタル博士論文
中村, 芳行Nara Institute of Science and Technology2006-03-24
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Studies on test generation and design for testability based on knowledge for LSIs

Studies on test generation and design for testability based on knowledge for LSIs
デジタル博士論文
中里, 昌人Nara Institute of Science and Technology2007-03-23
全国の図書館
  • 件名...test knowledge at-speed testing

Instruction-based self-testing of performance oriented faults in modern processors

Instruction-based self-testing of performance oriented faults in modern processors
デジタル博士論文
Singh, VirendraNara Institute of Science and Technology2005-09-30
全国の図書館
  • 件名...g VLSI testing at-speed testing Performance oriented faults d...

Studies on Design for Delay Testability and Delay Test Generation for Sequential Circuits

Studies on Design for Delay Testability and Delay Test Generation for Sequential Circuits
デジタル博士論文
岩垣, 剛Nara Institute of Science and Technology2004-09-30
全国の図書館

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