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NIST time and frequency services [microform] Rev. 2001 (NIST special publication ; 432)

NIST time and frequency services [microform] Rev. 2001 (NIST special publication ; 432)
マイクロ図書
2002<YCA-C 13.10:432/2/2002>
国立国会図書館
  • 一般注記Rev. ed. of: NIST time and frequ......91 "Supersedes NIST special publication 432, dated June 1991." "Janua...
  • 原資料等に関する注記...Technology Administration, National Institute of ...

NIST standard reference materials catalog [microform]. February 2003 (NIST special publication ; 260)

NIST standard reference materials catalog [microform]. February 2003 (NIST special publication ; 260)
マイクロ図書
2003<YCA-C 13.10:260/2003>
国立国会図書館

Proceedings of the NIST conformity assessment for a changing government workshop. : Dec 2001, ------. (NIST Special Publication ; 986)

Proceedings of the NIST conformity assessment for a changing government workshop. : Dec 2001, ------. (NIST Special Publication ; 986)
紙図書
2003.<M17-05-17>
国立国会図書館

The Tenth Text Retrieval Conference, TREC-2001 [microform] / E.M. Vorhees and D.K. Harman, editors (NIST special publication ; 550-250) (NIST special publication ; Information technology)

The Tenth Text Retrieval Conference, TREC-2001 [microform] / E.M. Vorhees and D.K. Harman, editors (NIST special publication ; 550-250) (NIST special publication ; Information technology)
マイクロ図書
2002<YCA-C 13.10:500-250>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Directory of state and local government laboratory accreditation/designation programs / Charles W. Hyer, editor (NIST special publication ; 815)

Directory of state and local government laboratory accreditation/designation programs / Charles W. Hyer, editor (NIST special publication ; 815)
マイクロ図書
2003<YCA-C 13.10:815/2003>
国立国会図書館
  • 一般注記...cm "Supersedes NIST SP 815, 2003 edition."
  • 原資料等に関する注記...Technology Administration, National Institute of ...

NIST at 100 [microform] : foundations for progress ([NIST special publication ; 956])

NIST at 100 [microform] : foundations for progress ([NIST special publication ; 956])
マイクロ図書
2000<YCA-C 13.10:956>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, U.S. Dept. of Commerce...
  • 並列タイトル等（連結）NIST at one hundred National Insti...
  • 並列タイトル等NIST at one hundred National Insti...

Error analysis and calibration uncertainty of capacitance standards at NIST [microform] / Y. May Chang (NIST special publication ; 250-52) (NIST special publication. NIST measurement services)

Error analysis and calibration uncertainty of capacitance standards at NIST [microform] / Y. May Chang (NIST special publication ; 250-52) (NIST special publication. NIST measurement services)
マイクロ図書
2000<YCA-C 13.10:250-52>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...

19th international symposium on automation and robotics in construction. : Sep 2002, Gaithersburg, MD. (NIST Special Publication ; 989)

19th international symposium on automation and robotics in construction. : Sep 2002, Gaithersburg, MD. (NIST Special Publication ; 989)
紙図書
U.S. Dept. of Commerce, National Institute of Standards and Technology2002.<M17-05-693>
国立国会図書館
  • タイトル標目NIST special publication ; 989.

The NIST-traceable Referene-Material program for wavelength- reference absorption cells / Timothy J. Drapela ... [et al.] (NIST special publication ; 260-151)

The NIST-traceable Referene-Material program for wavelength- reference absorption cells / Timothy J. Drapela ... [et al.] (NIST special publication ; 260-151)
マイクロ図書
2003<YCA-C 13.10:260-151>
国立国会図書館
  • 一般注記...sued under the NIST trademark that are well-chara...
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Highly charged ions [microform] : publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland / editors, John D. Gillaspy ... [et al.] (NIST special publication ; 972)

Highly charged ions [microform] : publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland / editors, John D. Gillaspy ... [et al.] (NIST special publication ; 972)
マイクロ図書
2002<YCA-C 13.10:972>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Mobile agent security [microform] / Wayne Jansen and Tom Karygiannis (NIST special publication ; 800-19) (NIST special publication. Computer security)

Mobile agent security [microform] / Wayne Jansen and Tom Karygiannis (NIST special publication ; 800-19) (NIST special publication. Computer security)
マイクロ図書
1999<YCA-C 13.10:800-19>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Eleventh International Conference on Computer Technology in Welding [microform] / T.A. Siewert, C. Pollock, eds (NIST special publication ; 973)

Eleventh International Conference on Computer Technology in Welding [microform] / T.A. Siewert, C. Pollock, eds (NIST special publication ; 973)
マイクロ図書
2002<YCA-C 13.10:973>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Optical fiber power meter calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-54) (NIST measurement services)

Optical fiber power meter calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-54) (NIST measurement services)
マイクロ図書
2000<YCA-C 13.10:250-54>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...
  • タイトル標目NIST special publication. NIST measurement services

Technical digest: symposium on optical fiber measurements, 2004 : September 28-30, 2004 : National Institute of Standards and Technology : Boulder, Colorado 80305. : SOFM 2004 : Sep 2004, Boulder, CO. (NIST Special Publication ; 1024)

Technical digest: symposium on optical fiber measurements, 2004 : September 28-30, 2004 : National Institute of Standards and Technology : Boulder, Colorado 80305. : SOFM 2004 : Sep 2004, Boulder, CO. (NIST Special Publication ; 1024)
紙図書
For sale by the Supt. of Docs., U.S. G.P.O.2004.<M17-06-515>
国立国会図書館

Optical fiber power meter nonlinearity calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-56) (NIST measurement services)

Optical fiber power meter nonlinearity calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-56) (NIST measurement services)
マイクロ図書
2000<YCA-C 13.10:250-56>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...
  • タイトル標目NIST special publication. NIST measurement services

Technical digest [microform] : Symposium on Optical Fiber Measurements, 2002 / edited by P.A. Williams, G.W. Day (NIST special publication ; 988)

Technical digest [microform] : Symposium on Optical Fiber Measurements, 2002 / edited by P.A. Williams, G.W. Day (NIST special publication ; 988)
マイクロ図書
2002<YCA-C 13.10:988>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Proceedings of the NIST centennial standards symposium : standards in the global economy: past, present, and future. : Mar 2001, ------. (NIST Special Publication ; 974)

Proceedings of the NIST centennial standards symposium : standards in the global economy: past, present, and future. : Mar 2001, ------. (NIST Special Publication ; 974)
紙図書
U.S. Dept. of Commerce, Office of Standards Services, Technology Services, National Institute of Standards and Technology2002.<M17-05-18>
国立国会図書館
  • 著者標目...ght, Walter G. NIST Centennial Standards Symposiu...

On the fractographic analysis of machining cracks in ground ceramics : a case study on silicon nitride / George D. Quinn, Lewis K. Ives, Said Jahanmir. (NIST special publication ; 996)

On the fractographic analysis of machining cracks in ground ceramics : a case study on silicon nitride / George D. Quinn, Lewis K. Ives, Said Jahanmir. (NIST special publication ; 996)
紙図書
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology[2003]<PA235-B2>
国立国会図書館

Directory of U.S. private sector product certification programs / Charles W. Hyer, editor 2001 ed (NIST special publication ; 903)

Directory of U.S. private sector product certification programs / Charles W. Hyer, editor 2001 ed (NIST special publication ; 903)
マイクロ図書
2001<YCA-C 13.10:903/2001>
国立国会図書館
  • 一般注記"Supersedes NIST spec. publ. 903, 1996 edition...
  • 原資料等に関する注記...Technology Administration, National Institute of ...

Particle size characterization [microform] / Ajit Jillavenkatesa, Stanley J. Dapkunas, Lin-Sien H. Lum (NIST special publication ; no. 960-1) (NIST recommended practice guide)

Particle size characterization [microform] / Ajit Jillavenkatesa, Stanley J. Dapkunas, Lin-Sien H. Lum (NIST special publication ; no. 960-1) (NIST recommended practice guide)
マイクロ図書
2001<YCA-C 13.10:960-1>
国立国会図書館
  • 原資料等に関する注記...Technology Administration, National Institute of ...
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