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Novel MCM interconnection analysis using Capacitive Charge Generation (CCG) SAND-95-2255C DE96 006997 CONF-9604291

Novel MCM interconnection analysis using Capacitive Charge Generation (CCG) SAND-95-2255C DE96 006997 CONF-9604291
Microform規格・テクニカルリポート類
Cole, E. I. Jr, Peterson, K. A, Burton, D. L1996<LS-DE96/006997>
National Diet Library

ELECTRON AND OPTICAL BEAM TESTING OF INTEGRATED CIRCUITS USING CIVA, LIVA, AND LECIVA (SAND ; SAND-95-1946C)

ELECTRON AND OPTICAL BEAM TESTING OF INTEGRATED CIRCUITS USING CIVA, LIVA, AND LECIVA (SAND ; SAND-95-1946C)
Paper図書
COLE, E.I. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR.

NOVEL MCM INTERCONNECTION ANALYSIS USING CAPACITIVE CHARGE GENERATION (CCG) (SAND ; SAND-95-2255C)

NOVEL MCM INTERCONNECTION ANALYSIS USING CAPACITIVE CHARGE GENERATION (CCG) (SAND ; SAND-95-2255C)
Paper図書
COLE, E.I. JR.// PETERSON, K.A.// BURTON, D.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. PETERSON, K.A. BURTON, D.L.

NON-INVASIVE CURRENT AND VOLTAGE IMAGING TECHNIQUES FOR INTEGRATED CIRCUITS USING SCANNING PROBE MICROSCOPY. FINAL REPORT, LDRD PROJECT FY93 AND FY94 (SAND ; SAND-95-0758)

NON-INVASIVE CURRENT AND VOLTAGE IMAGING TECHNIQUES FOR INTEGRATED CIRCUITS USING SCANNING PROBE MICROSCOPY. FINAL REPORT, LDRD PROJECT FY93 AND FY94 (SAND ; SAND-95-0758)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// TANGYUNYONG, PAIBOON. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. TANGYUNYONG, PAIBOON.

LOCALIZATION OF PELLICLE-INDUCED OPEN CONTACTS USING CHARGE-INDUCED VOLTAGE ALTERATION (SAND ; SAND-93-0456C)

LOCALIZATION OF PELLICLE-INDUCED OPEN CONTACTS USING CHARGE-INDUCED VOLTAGE ALTERATION (SAND ; SAND-93-0456C)
Paper図書
COLE, E.I. JR.// SODEN, J.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M.

SCANNING ELECTRON MICROSCOPY TECHNIQUES (SAND ; SAND-92-0143C)

SCANNING ELECTRON MICROSCOPY TECHNIQUES (SAND ; SAND-92-0143C)
Paper図書
COLE, E.I. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR.

LOW ELECTRON BEAM ENERGY CIVA ANALYSIS OF PASSIVATED ICS (SAND ; SAND-94-1167C)

LOW ELECTRON BEAM ENERGY CIVA ANALYSIS OF PASSIVATED ICS (SAND ; SAND-94-1167C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// DODD, B.A.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M. DODD, B.A. HENDER...

USE OF THE CHARGE-INDUCED VOLTAGE ALTERATION TECHNIQUE TO ANALYZE PRECURSORS TO DIELECTRIC BREAKDOWN (SAND ; SAND-92-0462C)

USE OF THE CHARGE-INDUCED VOLTAGE ALTERATION TECHNIQUE TO ANALYZE PRECURSORS TO DIELECTRIC BREAKDOWN (SAND ; SAND-92-0462C)
Paper図書
BARTON, D.L.// COLE, E.I. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan
  • Author HeadingBARTON, D.L. COLE, E.I. JR.

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// DODD, B.A.// ANDERSON, R.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. DODD, B.A. ANDERSON, R.E.

LIGHT EMISSION MICROSCOPY (SAND ; SAND-92-0145C)

LIGHT EMISSION MICROSCOPY (SAND ; SAND-92-0145C)
Paper図書
SODEN, J.M.// COLE, E.I. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1992.
Other Libraries in Japan
  • Author HeadingSODEN, J.M. COLE, E.I. JR.

OBIC ANALYSIS OF STRESSED, THERMALLY-ISOLATED POLYSILICON RESISTORS (SAND ; SAND-94-2464C)

OBIC ANALYSIS OF STRESSED, THERMALLY-ISOLATED POLYSILICON RESISTORS (SAND ; SAND-94-2464C)
Paper図書
COLE, E.I. JR.// PETERSON, K.A.// CAMPBELL, A.N.// SNYDER, E.S.// PIERCE, D.G.// SUEHLE, J.S.// CHAPARALA, P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. PETERSON, K.A. CAMPBELL, A.N....

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// RIFE, J.L.// BARTON, D.L.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M. RIFE, J.L. BARTON...

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)
Paper図書
A.N. Campbell [et al.]Sandia National Labs.1992.12.
Other Libraries in Japan
  • Author HeadingCampbell, A.N. Cole, E.I. Jr. Dodd, B.A. Anderson, R.E.

RAPID LOCALIZATION OF IC OPEN CONDUCTORS USING CHARGE-INDUCED VOLTAGE ALTERATION (CIVA) (SAND ; SAND-91-1850C)

RAPID LOCALIZATION OF IC OPEN CONDUCTORS USING CHARGE-INDUCED VOLTAGE ALTERATION (CIVA) (SAND ; SAND-91-1850C)
Paper図書
COLE, E.I. JR.// ANDERSON, R.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. ANDERSON, R.E.

NEW TECHNIQUE FOR IMAGING THE LOGIC STATE OF PASSIVATED CONDUCTORS: BIASED RESISTIVE CONTRAST IMAGING (SAND ; SAND-89-2384C)

NEW TECHNIQUE FOR IMAGING THE LOGIC STATE OF PASSIVATED CONDUCTORS: BIASED RESISTIVE CONTRAST IMAGING (SAND ; SAND-89-2384C)
Paper図書
COLE, E.I. JRSandia National Laboratories(Sandia National Laboratories)1990.
Other Libraries in Japan

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// HENDERSON, C.L.// TAYLOR, M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. HENDERSON, C.L. TAYLOR, M.R.

USE OF LIGHT EMISSION IN FAILURE ANALYSIS OF CMOS ICS (SAND ; SAND-90-1169C)

USE OF LIGHT EMISSION IN FAILURE ANALYSIS OF CMOS ICS (SAND ; SAND-90-1169C)
Paper図書
HAWKINS, C.F.// SODEN, J.M.// COLE, E.I. JR.// SNYDER, E.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (USA))Sandia National Laboratories(Sandia National Laboratories)1990.
Other Libraries in Japan
  • Author HeadingHAWKINS, C.F. SODEN, J.M. COLE, E.I. JR. SNYDER, E.S.

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