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Large scale integration digital testing : annotated bibliography, 1969-1978 / Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards. (NBS technical note ; 1102)

Large scale integration digital testing : annotated bibliography, 1969-1978 / Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards. (NBS technical note ; 1102)
Paper図書
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1979.<ND1-22>
National Diet Library
  • Author HeadingLeedy, T. F. Center for Electronics and Electrical Engineering (U.S.) . Electron Devices Division.

Measurement techniques for high power semiconductor materials and devices / U.S. Department of Commerce, National Bureau of Standards, National Engineering Laboratory, Center for Electronics and Electrical Engineering, Semiconductor Materials and Processes Division ; prepared for Department of Energy, Division of Electric Energy Systems. (NBSIR)

Measurement techniques for high power semiconductor materials and devices / U.S. Department of Commerce, National Bureau of Standards, National Engineering Laboratory, Center for Electronics and Electrical Engineering, Semiconductor Materials and Processes Division ; prepared for Department of Energy, Division of Electric Energy Systems. (NBSIR)
Paper図書
The Division19uu.<ND371-23>
National Diet Library
  • Author Heading...sses Division. Center for Electronics and Electrical Engineering (U.S.) . Electron Devices Division.

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