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Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004 : Denver, Colorado, USA. : Aug 2004, Denver, CO. (SPIE Proceedings ; 5526)

Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004 : Denver, Colorado, USA. : Aug 2004, Denver, CO. (SPIE Proceedings ; 5526)
Paper図書
SPIEc2004.<M17-04-3674>
National Diet Library
  • Author HeadingChen, Philip T. Fleming, John C. Dittman, Mic...

Optical system contamination: effects, measurements, and control 7 : 9-11 July 2002 : Seattle, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4774)

Optical system contamination: effects, measurements, and control 7 : 9-11 July 2002 : Seattle, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4774)
Paper図書
SPIEc2002.<M17-03-4394>
National Diet Library
  • Author HeadingBoeing Company. Chen, Philip T. Uy, O. Manuel.

Contamination effects due to space environmental interactions AIAA-2001-0095

Contamination effects due to space environmental interactions AIAA-2001-0095
Paper規格・テクニカルリポート類
Chen, Philip T2001<M-AIAA-2001-0095>
National Diet Library

Applying contamination modeling to spacecraft propulsion system designs and operations AIAA-2000-0461

Applying contamination modeling to spacecraft propulsion system designs and operations AIAA-2000-0461
Paper規格・テクニカルリポート類
Chen, Philip T, Thomson, Shaun, Woronowicz, Michael S2000<M-AIAA-2000-0461>
National Diet Library

Contamination effects and resolutions on the GOES thermal control system AIAA-96-0241

Contamination effects and resolutions on the GOES thermal control system AIAA-96-0241
Paper規格・テクニカルリポート類
Chen, Philip T, Hedgeland, Randy J1996<M-AIAA-96-0241>
National Diet Library

1997 Spacecraft Contamination and Coatings Workshop [microform] / organized by Philip T. Chen, Steve M. Benner ; sponsored by National Aeronautics and Space Administration, Office of Space Science, Space Environments and Effects Program (NASA conference publication ; 3361)

1997 Spacecraft Contamination and Coatings Workshop [microform] / organized by Philip T. Chen, Steve M. Benner ; sponsored by National Aeronautics and Space Administration, Office of Space Science, Space Environments and Effects Program (NASA conference publication ; 3361)
Microform図書
1997<YCA-NAS 1.55:3361>
National Diet Library

The Coatings and Environmental Effects Monitor (CEEM) flight experiment AIAA-96-0224

The Coatings and Environmental Effects Monitor (CEEM) flight experiment AIAA-96-0224
Paper規格・テクニカルリポート類
Straka, Sharon A, Chen, Philip T, McIntosh, Roy, Banks, Bruce A, Uy, Manuel, Bugby, David C, Triolo, Jack J1996<M-AIAA-96-0224>
National Diet Library

Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA

Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA
Paper図書
Philip T. Chen, O. Manuel Uy, chairs/editors ; sponsored by SPIE--the International Society for Optical EngineeringSPIEc2000
Other Libraries in Japan
  • Author HeadingChen, Philip T. Uy, O. Manuel

Optical systems contamination and degradation : 20-23 July 1998, San Diego, California

Optical systems contamination and degradation : 20-23 July 1998, San Diego, California
Paper図書
Philip T. Chen, William E. MacClintock, Gary J. Rottman, chairs/editors ; sponsored by SPIE--the International Society for Optical EngineeringSPIEc1998
Other Libraries in Japan
  • Author HeadingChen, Philip T. McClintock, William E. Rottma...

Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004, Denver, Colorado, USA

Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004, Denver, Colorado, USA
Paper図書
Philip T. C. Chen, John C. Fleming, Michael G. Dittman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2004
Other Libraries in Japan
  • Author HeadingChen, Philip T. C. Fleming, John C. Dittman, ...

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA
Paper図書
Philip T.C. Chen, O. Manuel Uy chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) ... [et al.]SPIEc2002
Other Libraries in Japan
  • Author HeadingSociety of Photo-optical Instrumentation Engineers Chen, Philip T. C. Uy, O. Manuel

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado pbk.

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado pbk.
Paper図書
Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and pubslished by SPIE--The International Society for Optical EngineeringSPIE1999
Other Libraries in Japan
  • Author HeadingChen, Philip T. C. Gu, Zu-Han Maradudin, A. A...

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